PUBLICATIONS AND Conferences

 

Selected Publications (from a total of more than 320)

 

1.     R.W. Collins, P.C. Taylor, R. Biswas, R. Carius, and M. Kondo (eds.) Amorphous and Nanocrystalline Silicon Silicon Science and Technology - 2005, Materials Research Society Symposium Proceedings, (Materials Research Society, Warrendale, PA, 2005) vol. 862.

2.     R.W. Collins and A.S. Ferlauto, "Optical Physics of Materials", in: Handbook of Ellipsometry, edited by H.G. Tompkins and E.A. Irene, (William Andrew, Norwich, NY, 2005) pp. 93-236.

3.     R.W. Collins, "Ellipsometry" in:  The Optics Encyclopedia, edited by Th.G. Brown, K. Creath, H. Kogelnik, M.A. Kriss, J. Schmit, and M.J. Weber, (Wiley-VCH, Weinheim, 2004) pp. 609-670.

4.     R.W. Collins, A.S. Ferlauto, G.M. Ferreira, C. Chen, J. Koh, R.J. Koval, Y. Lee, J.M. Pearce, and C.R. Wronski, "Evolution of microstructure and phase in amorphous, protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry",  Solar Energy Materials and Solar Cells 78, 143 (2003).

5.     C. Chen, I. An, and R.W. Collins, "Multichannel Mueller matrix ellipsometry for ... real-time measurement of bulk isotropic and surface anisotropic complex dielectric functions of semiconductors", Physical Review Letters 90, 217402 (2003).

6.     R.W. Collins and A.S. Ferlauto, "Advances in plasma-enhanced chemical vapor deposition of silicon films at low temperatures", Current Opinion in Solid State & Materials Science 6, 425 (2002).

7.     A.S. Ferlauto, G.M. Ferreira, J.M. Pearce, C.R. Wronski, R.W. Collins, X.M. Deng, and G. Ganguly, "Analytical model for the optical functions of amorphous semiconductors from the near-infrared to ultraviolet:  applications in thin film photovoltaics", Journal of Applied Physics 92, 2424 (2002).