Podraza Bibliography



Summary of Bibliography


Notes:

Current and previous direct student advisees are italicized

* Indicates given by Faculty Advisor

Faculty or Postdoctoral Collaborator

# Graduate Student Advisee

† Graduate Student Collaborator (while a student)

‡ Graduate Student of a Faculty Collaborator

Encyclopedia and Magazine Articles:

  1. Huang, Z., L. R. Dahal, P. Koirala, W. Du, S. Cao, X. Deng, N. J. Podraza, and R. W. Collins, “Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon,” Characterization of Photovoltaic Materials and Devices by Spectroscopic Ellipsometry:  Si, CdTe, CIGS, Organic, and Perovskite Solar Cells (Springer), in press 2017.
  2. Ibdah, A.-R. A., P. Aryal, P. Pradhan, S. Marsillac, N. J. Podraza, and R. W. Collins, “Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization,” Characterization of Photovoltaic Materials and Devices by Spectroscopic Ellipsometry:  Si, CdTe, CIGS, Organic, and Perovskite Solar Cells (Springer), in press 2017.
  3. Koirala, P., A.-R. A. Ibdah, P. Aryal, P. Pradhan, Z. Huang, N. J. Podraza, S. Marsillac, and R. W. Collins, “Optical Simulation of External Quantum Efficiency Spectra,” Characterization of Photovoltaic Materials and Devices by Spectroscopic Ellipsometry:  Si, CdTe, CIGS, Organic, and Perovskite Solar Cells (Springer), in press 2017.
  4. Shan, A., J. Chen, P. Koirala, K. R. Kormanyos, N. J. Podraza, and R. W. Collins, “On-Line Monitoring of Solar Cell Production,” Characterization of Photovoltaic Materials and Devices by Spectroscopic Ellipsometry:  Si, CdTe, CIGS, Organic, and Perovskite Solar Cells (Springer), in press 2017.
  5. Huang, Z., L. R. Dahal, S. Marsillac, N. J. Podraza, and R. W. Collins, “Real Time and Mapping Spectroscopic Ellipsometry of Hydrogenated Amorphous and Nanocrystalline Si Solar Cells,” Characterization of Photovoltaic Materials and Devices by Spectroscopic Ellipsometry:  Si, CdTe, CIGS, Organic, and Perovskite Solar Cells (Springer), in press 2017.
  6. Podraza, N. J., “High Efficiency III-V Solar Cells,” Characterization of Photovoltaic Materials and Devices by Spectroscopic Ellipsometry:  Si, CdTe, CIGS, Organic, and Perovskite Solar Cells (Springer), in press 2017.
  7. Pradhan, P., A.-R. A. Ibdah, P. Aryal, D. Attygalle, N. J. Podraza, S. Marsillac, and R. W. Collins, “Real Time Measurement, Monitoring, and Control of CuIn1-xGaxSe2 by Spectroscopic Ellipsometry,” Characterization of Photovoltaic Materials and Devices by Spectroscopic Ellipsometry:  Si, CdTe, CIGS, Organic, and Perovskite Solar Cells (Springer), in press 2017.
  8. Koirala, P., J. Li, N. J. Podraza, and R. W. Collins, “Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics,” Characterization of Photovoltaic Materials and Devices by Spectroscopic Ellipsometry:  Si, CdTe, CIGS, Organic, and Perovskite Solar Cells (Springer), in press 2017.
  9. Fujiwara, H., N. J. Podraza, M. I. Alonso, M. Kato, K. Ghimire, T. Miyadera, and M. Chikamatsu, “Organic-Inorganic Hybrid Perovskite Solar Cells,” Characterization of Photovoltaic Materials and Devices by Spectroscopic Ellipsometry:  Si, CdTe, CIGS, Organic, and Perovskite Solar Cells (Springer), in press 2017.
  10. Podraza, N. J., and M. R. Linford, “Archiving the Optical Constants of Materials with Surface Science Spectra,” Vacuum Technology & Coating October, 2 (2017).
  11. Li, J., R. W. Collins, M. N. Sestak, N. J. Podraza, S. Marsillac, and A. Rockett, “Spectroscopic Ellipsometry,” Advanced Characterization Techniques for Thin Film Solar Cells 2nd Edition (Wiley), 2016.
  12. Cushman, C. V., N. Smith, M. Kaykhaii, N. J. Podraza, and M. R. Linford, “An Introduction to Modeling in Spectroscopic Ellipsometry, Focusing on Models for Transparent Materials:  The Cauchy and Sellmeier Models,” Vacuum Technology & Coating July, 2 (2016).
  13. Podraza, N. J. and G. E. Jellison Jr, “Ellipsometry,” Reference Module in Chemistry, Molecular Sciences and Engineering (Elsevier), 2014.
  14. Podraza, N. J. and B. H. Billings, “Crystal Optics,” Encyclopedia of Science and Technology 11th Edition  (McGraw Hill), 2012.
  15. Podraza, N. J., “Dichroism,” Encyclopedia of Science and Technology 11th Edition (McGraw Hill), 2012.
  16. Podraza, N. J., “Birefringence,” in Encyclopedia of Science and Technology 11th Edition (McGraw Hill), 2012.

Refereed Journal Publications:

  1. Junda, M. M., and N. J. Podraza, “Optical Properties of Soda Lime Float Glass from 3 mm to 148 nm (0.41 meV to 8.38 eV) by Spectroscopic Ellipsometry,” submitted to Surface Science Spectra (2018).
  2. Uprety, P., M. M. Junda, H. Salmon, and N. J. Podraza, “Understanding Near Infrared Absorption in Tin Doped Indium Oxide Thin Films,” submitted to Journal of Physics D:  Applied Physics (2018).
  3. Subedi, B., L. Guan, Y. Yue, K. Ghimire, P. Uprety, Y. Yan, and N. J. Podraza, “Formamidinium + Cesium Lead Triiodide Perovskites:  Discrpencies between Thin Film Optical Absorption and Solar Cell Efficiency,” submitted to Solar Energy Materials & Solar Cells (2018).
  4. Bastola, E., K. Bhandari, I. Subedi, N. J. Podraza, and R. Ellingson, “Earth-Abundant Chalcopyrite CuFeS2 Nanocrystals for Photovoltaics:  Structural, Optical, and Hole Transport Properties,” submitted to ACC Applied Nano Materials (2017).
  5. Uprety, P., B. Macco, M. M. Junda, C. R. Grice, W. M. M. Kessels, and N. J. Podraza, “Optical and Electrical Properties of H-Doped ZnO Films Prepared by Atomic Layer Deposition Using Supercycles with Plasma-Treatment,” submitted to Materials Science in Semiconductor Processing (2017).
  6. Rajan, G., S. Karki, N. J. Podraza, R. W. Collins, and S. Marsillac, “Enhancing Ultra-Thin Cu(In,Ga)Se2 Solar Cell Efficiency via Multilayer Anti-Reflection Coatings Optimization,” submitted to Applied Physics Letters (2017).
  7. Rajan, G., S. Karki, T. Ashrafee, R. W. Collins, N. J. Podraza, and S. Marsillac, “Real Time Optimization of Anti-Reflective Coatings for CIGS Solar Cells,” submitted to Progress in Photovoltaics (2017).
  8. Ibdah, A. A., P. Uprety, P. Aryal, P. Pradhan, M. J. Heben, N. J. Podraza, S. Marsillac, and R. W. Collins, “Optical Simulation of External Quantum Efficiency Spectra of CuIn1-xGaxSe2 Solar Cells from Spectroscopic Ellipsometry Inputs,” Journal of Energy Chemistry in press (2017).
  9. Pradhan, P., P. Aryal, D. Attygale, A. A. Ibdah, P. Koirala, J. Li, K. P. Bhandari, G. K. Liyanage, R. J. Ellingson, M. Heben, S. Marsillac, R. W. Collins, and N. J. Podraza, “Real Time Spectroscopic Ellipsometry Analysis of First Stage CuIn1-xGaxSe2 Growth:  Indium-Gallium Selenide Co-Evaporation,” Materials 11, 145 (2018).
  10. Silverman, T. J, M. G. Deceglie, I. Subedi, N. J. Podraza, I. M. Slauch, V. E. Ferry, and I. Repins, “Reducing Operating Temperature in Photovoltaic Modules,” IEEE Journal of Photovoltaics 8, 532 (2018).
  11. Szymanski, N., N. J. Podraza, T. Alderson, P. Sarin, and S. V. Khare, “Electronic and Optical Properties of Vanadium Oxides from First Principles,” submitted to Computational Materials Science 146, 310 (2018).
  12. Junda, M., L. Karki Gautam, R. W. Collins, and N. J. Podraza, “Optical Gradients in a-Si:H Thin Films Detected Using Real-Time Spectroscopic Ellipsometry with Virtual Interface Analysis,” Applied Surface Science 436, 779 (2018).
  13. Junda, M., A. Phillips, M. Heben, and N. J. Podraza, “Determination of the Role of Doping and Conductivity Anisotropy in Single Walled Carbon Nanotube Thin Films with THz Spectroscopic Ellipsometry,” Carbon 129, 592 (2018).
  14. Uprety, P., M. Junda, and N. J. Podraza, “Optical Properties of Borosilicate Glass from the Millimeter to Ultraviolet Wavelength Range,” Surface Science Spectra 24, 026003 (2017).
  15. Liu, Z. T. Y., N. J. Podraza, S. V. Khare, and P. Sarin, “Transparency Enhancement for SrVO3 by SrTiO3 Mixing:  A First-Principles Study,” Computational Materials Science 144, 139 (2017).
  16. Subedi, I., T. J Silverman, M. Deceglie, and N. J. Podraza, “Al+Si Interface Optical Properties obtained in the Si Solar Cell Configuration,” Physica Status Solidi a 214, 1700480 (2017).
  17. Uprety, P., K. Lambright, M. M. Junda, C. R. Grice, D. M. Giolando, and N. J. Podraza, “Infrared to Ultraviolet Optical Properties of Low Temperature Processed SnO2:F,” Physica Status Solidi b 254, 1700102 (2017).
  18. Wang, C., C. Xiao, Y. Yu, D. Zho, R. A. Awni, C. R. Grice, K. Ghimire, D. Constantinou, W. Liao, A. J. Cimaroli, P. Liu, J. Chen, N. J. Podraza, C.-S. Jiang, M. M. Al-Jassim, X. Zhao, and Y. Yan, “Understanding and Eliminating Hysteresis for Highly Efficient Planer Perovskite Solar Cells,” Advanced Energy Materials 7, 1700414(2017).
  19. Uprety, P., M. M. Junda, K. Ghimire, D. Adhikari, and N. J. Podraza, “Spectroscopic Ellipsometry Determination of Optical and Electrical Properties of Aluminum Doped Zinc Oxide,” Applied Surface Science 421, 852 (2017).
  20. Subedi, I., M. Slocum, D. Forbes, S. Hubbard, and N. J. Podraza,” Optical Properties of InP from Infrared to Vacuum Ultraviolet Studied by Spectroscopic Ellipsometry,” Applied Surface Science 421, 813 (2017).
  21. Brakstad, T., B. R. Hope, M. Nematollahi, M. Kildemo, N. J. Podraza, K. Ghimire, and T. W. Reenaas, “Ellipsometric Study of the Optical Response of ZnS:Cr for PV Applications,”  Applied Surface Science 421, 315 (2017).
  22. Ibdah, A., P. Koirala, A. Ibdah, P. Aryal, P. Pradhan, S. Marsillac, A. A. Rockett, N. J. Podraza, and R. W. Collins, “Spectroscopic Ellipsometry for Analysis of Polycrystalline Thin-Film Photovoltaic Devices and Prediction of External Quantum Efficiency,” Applied Surface Science 421, 601 (2017).
  23. Adhikari, D., M. Junda, S. Marsillac, R. W. Collins, and N. J. Podraza, “Nanostructure Evolution of Magnetron Sputtered Hydrogenated Silicon Thin Films,” Journal of Applied Physics 122, 075302 (2017).
  24. Macco, B., J. Melskens, N. J. Podraza, K. Arts, C. Pugh, O. Thomas, and W. Kessels, “Correlating Silicon Surface Passivation to the Nanostructure of Low-Temperature a-Si:H After Rapid Thermal Annealing,” Journal of Applied Physics 122, 035302 (2017).
  25. Ghimire, K., D. Zhao, Y. Yan, and N. J. Podraza, “Optical Response of Mixed Methylammonium Lead Iodide and Formamidinium Tin Iodide Perovskite Thin Films,” AIP Advances 7, 075108 (2017).
  26. Itapu, S., D. Georgiev, P. Uprety, and N. J. Podraza, “Effect of Laser Irradiation on the Properties of Reactively Sputtered NiOx Thin Films,” Physica Status Solidi a 214, 1600414 (2017).
  27. Adhikari, D., M. M. Junda, P. Uprety, K. Ghimire, I. Subedi, and N. J. Podraza, “Near Infrared to Ultraviolet Optical Properties of Single Crystal SrLaAlO4 from Spectroscopic Ellipsometry,” Physica Status Solidi b 253, 2066 (2016).
  28. Liao, W., D. Zhao, Y. Yu, N. Shrestha, K. Ghimire, C. R. Grice, C. Wang, Y. Xiao, A. J. Cimaroli, R. J. Ellingson, N. J. Podraza, K. Zhu, R.-G. Xiong, and Y. Yan, “Fabrication of Efficient Low-Bandgap Perovskite Solar Cells by Combining Formamidinium Tin Iodide with Methylammonium Lead Iodide,” Journal of the American Chemical Society 138, 12360 (2016).
  29. Barnes, A., H. Haneef, D. G. Schlom, and N. J. Podraza, “Optical Band Gap and Infrared Phonon Modes of (La0.29Sr0.71)(Al0.65Ta0.36)O3 (LSAT) Single Crystal from Infrared to Ultraviolet Range Spectroscopic Ellipsometry,” Optical Materials Express 6, 3210 (2016).
  30. Ghimire, K., D. Zhao, A. Cimaroli, W. Ke, Y. Yan, and N. J. Podraza, “Optical Monitoring of CH3NH3PbI3 Thin Films Upon Atmospheric Exposure,” Journal of Physics D:  Applied Physics 49, 405102 (2016).
  31. Zhang, C., C. Pfeiffer, T. Jang, V. Ray, M. Junda, P. Uprety, N. Podraza, A. Grbic, and L. J. Guo, “Breaking Malus’ Law:  Highly Efficient, Broadband, and Angular Robust Asymmetric Light Transmitting Metasurface,” Laser & Photonics Reviews 10, 791-798 (2016).
  32. Junda, M. M., C. R. Grice, I. Subedi, Y. Yan, and N. J. Podraza, “Effects of Oxygen Partial Pressure, Deposition Temperature, and Annealing on the Optical Response of CdS:O Thin Films as Studied by Spectroscopic Ellipsometry,” Journal of Applied Physics 120, 015306 (2016).
  33. Aryal, P., A. Ibdah, P. Pradhan, D. Attygalle, P. Koirala, N. J. Podraza, S. Marsillac, R. W. Collins, and J. Li, “Parameterized Complex Dielectric Functions of CuIn1-xGaxSe2:  Applications in Optical Characterization of Compositional Non-Uniformities and Depth Profiles in Materials and Solar Cells,” Progress in Photovoltaics 24, 1200 (2016).
  34. Koirala, P., J. Li, X. Tan, H. Yoon, P. Aryal, P. Pradhan, A. Ibdah, S. Marsillac, A. A. Rockett, N. J. Podraza, and R. W. Collins, “Through-the-Glass Spectroscopic Ellipsometry for Analysis of the Optical Structure of CdTe Thin-Film Solar Cells in the Superstrate Configuration,” Progress in Photovoltaics 24, 1055 (2016).
  35. Karki Gautam, L., L. Ye, and N. J. Podraza, “LPCVD Thin Film Silicon Nitride,” Surface Science Spectra 23, 51 (2016).
  36. Subedi, I., K. Bhandari, R. Ellingson, and N. J. Podraza, “Near Infrared to Ultraviolet Optical Properties of Bulk Single Crystal and Nanocrystal Thin Film Iron Pyrite,” Nanotechnology 27, 295702 (2016).
  37. Luo, J., H. He, N. J. Podraza, L. Qian, C. G. Pantano, and S. H. Kim, “Thermal Poling of Soda Lime Silica Glass with Nonblocking Electrodes—Part 1:  Effects of Sodium Ion Migration and Water Ingress on Glass Surface Structure,” Journal of the American Ceramic Society 99, 1221 (2016).
  38. Karki Gautam, L., M. M. Junda, H. F. Haneef, R. W. Collins, and N. J. Podraza, “Spectroscopic Ellipsometry Studies of n-i-p Hydrogenated Amorphous Silicon Based Photovoltaic Devices,” Materials 9, 128 (2016).
  39. Bharadwaja, S. S. N., A. Rajashekhar, S. W. Ko, W. Qu, M. Motyka, N. Podraza, T. Clark, C. A. Randall, and S. Trolier-McKinstry, “Excimer Laser Assisted Re-oxidation of BaTiO3 Thin Films on Ni Metal Foils,” Journal of Applied Physics 119, 024106 (2016
  40. Zhang, L., Y. Zhou, L. Guo, W. Zhao, A. Barnes, H.-T. Zhang, C. Eaton, Y. Zheng, M. Brahlek, H. F. Haneef, N. J. Podraza, M. H. W. Chan, V. Gopalan, K. M. Rabe, R. Engel-Herbert, “Correlated Metals as Transparent Conductors,” Nature Materials 15, 204 (2016
  41. Huang, Z., L. R. Dahal, M. M. Junda, P. Aryal, S. Marsillac, R. W. Collins, and N. J. Podraza, “Characterization of Structure and Growth Evolution for nc-Si:H in the Tandem Photovoltaic Device Configuration,” Journal of Photovoltaics 5, 1516 (2015).
  42. Ghimire, K., H. Haneef, R. W. Collins, and N. J. Podraza, “Optical Properties of Single Crystal Gd3Ga5O12 from the Infrared to Ultraviolet,” Physica Status Solidi b 252, 2191 (2015).
  43. Jin, Y. O. D. Saint John, N. J. Podraza, T. N. Jackson, and M. W. Horn, "High TCR Molybdenum Oxide and Nickel Oxide Thin Films for Microbolometer Applications," Optical Engineering 54, 037101 (2015).
  44. Choi, S. G., J. Kang, J. Li, H. Haneef, N. J. Podraza, C. Beall, S.-H. Wei, and I. L. Repins, “Optical Function Spectra and Band-Gap Energy of Cu2SnSe3,” Applied Physics Letters 106, 043902 (2015).
  45. Junda, M. M., S. Ambalanath, P. Koirala, R. W. Collins, and N. J. Podraza, “Spectroscopic Ellipsometry Applied in the Full p-i-n a-Si:H Solar Cell Device Configuration,” Journal of Photovoltaics 5, 307 (2015).
  46. Karki Gautam, L., H. Haneef, M. M. Junda, D. B. Saint John, and N. J. Podraza, “Approach for Extracting Complex Dielectric Function Spectra in Weakly-Absorbing Regions,” Thin Solid Films 571, 548 (2014).
  47. Koirala, P., D. Attygalle, P. Aryal, P. Pradhan, J. Chen, S. Marsillac, A. S. Ferlauto, N. J. Podraza, and R. W. Collins, “Real Time Spectroscopic Ellipsometry for Analysis and Control of Thin Film Polycrystalline Semiconductor Deposition in Photovoltiacs,” Thin Solid Films 571, 442(2014).
  48. Pandey, A., B. Cai, N. Podraza, and D. A. Drabold, “Electrical Activity of Boron and Phosphorus in Hydrogenated Amorphous Silicon,” Physical Review Applied 2, 054005 (2014).
  49. Haneef, H., and N. J. Podraza, “Optical Properties of Single Crystal Bi4Ge3O12 from the Infrared to Ultraviolet,” Journal of Applied Physics 116, 163507 (2014).
  50. Dahal, L. R., J. Li, J. A. Stoke, Z. Huang, A. Shan, A. S. Ferlauto, C. R. Wronski, R. W. Collins, and N. J. Podraza, “Applications of Real-Time and Mapping Spectroscopic Ellipsometry for Process Development and Optimization in Hydrogenated Silicon Thin-Film Photovoltaics Technology,” Solar Energy Materials & Solar Cells 129, 32 (2014).
  51. Sallis, S., K. T. Butler, N. F. Quackenbush, D. S. Wiliams, M. Junda, D. A. Fischer, J. C. Woicik, N. J. Podraza, B. E. White Jr., A. Walsh, and L. F. J. Piper, “Origin of Deep Subgap States in Amorphous IGZO: Chemically Disordered Coordination of Oxygen,” Applied Physics Letters 104, 232108 (2014).
  52. Aryal, P., P. Pradhan, D. Attygalle, A.R. A. Ibdah, K. Aryal, V. Ranjan, S. Marsillac, N. J. Podraza, and R. W. Collins, “Real-Time, In-Line, and Mapping Spectroscopic Ellipsometry for Applications in Cu(In1-xGax)Se2 Metrology,” Journal of Photovoltaics 4, 333 (2014).
  53. Shan, A., M. Fried, G. Juhasz, C. Major, O. Polgar, A. Nemeth, P. Petrik, L. R. Dahal, J. Chen, Z. Huang, N. J. Podraza, and R. W. Collins, “High-Speed Imaging / Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin-Film Photovoltaics,” Journal of Photovoltaics 4, 355 (2014).
  54. Shin, Hang-Beum, D. Saint John, M.-Y. Lee, N. J. Podraza, and T. N. Jackson, “Electrical Properties of PECVD a-Si:H and a-Si1-xCx:H for Microbolometer Applications,” Journal of Applied Physics 114, 183705 (2013).
  55. Stoughton, S., M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, K. E. Smith, L. F. Kourkoutis, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Schlom, “Adsorption-Controlled Growth of BiVO4 by Molecular-Beam Epitaxy,” Applied Physics Letters Materials 1, 042112(2013).
  56. Podraza, N. J., W. Qui, B. B. Hinojosa, H. Xu, M. A. Motyka, S. R. Phillpot, J. E. Baciak, S. Trolier-McKinstry, and J. C. Nino, “Band Gap and Structure of Single Crystal BiI3: Resolving Discrepancies in Literature,” Journal of Applied Physics 114, 033110 (2013).
  57. Haislmaier, R. C., N. J. Podraza, S. Denev, A. Melville, D. G. Schlom, and V. Gopalan, “Large Nonlinear Optical Coefficients in Pseudo-Tetragonal BiFeO3 Thin Films,” Applied Physics Letters 103, 031906 (2013).
  58. Banai, R. E., H. Lee, M. A. Motyka, R. Chandrasekharan, N. J. Podraza, J. R. S. Brownson, and M. W. Horn, “Optical Properties of Sputtered SnS Thin Films for Photovoltaic Absorbers,” Journal of Photovoltaics 3, 1084 (2013).
  59. Lee, C.-H., N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of Reduced Dimensionality on the Optical Band Gap of SrTiO3,” Applied Physics Letters 102, 122901 (2013).
  60. Dahal, L. R., Z. Huang, D. Attygalle, C. Salupo, N. J. Podraza, and R. W. Collins, “Correlations between Mapping Spectroscopic Ellipsometry Results and Solar Cell Performance for Evaluations of Non-Uniformity in Thin Film Silicon Photovoltaics,” Journal of Photovoltaics 3, 387 (2013).
  61. Attygalle, D., V. Ranjan, P. Aryal, P. Pradhan, S. Marsillac, N. J. Podraza, and R. W. Collins, “Optical Monitoring and Control of Cu(In1-xGax)Se2 by Three-Stage Co-Evaporation Using Real Time Spectroscopic Ellipsometry,” Journal of Photovoltaics 3, 375 (2013).
  62. Aryal, P., D. Attygalle, N. J. Podraza, S. Marsillac, and R. W. Collins, “Large Area Compositional Mapping of Cu(In1-xGax)Se2 Materials and Devices with Spectroscopic Ellipsometry,” Journal of Photovoltaics 3, 359 (2013).
  63. Yang, J. C., Q. He, S. J. Suresha, C. Y. Kuo, C. Y. Peng, R. C. Haislmaier, M. A. Motyka, G. Sheng, C. Adamo, H. J. Lin, Z. Hu, L. Chang, L. H. Tjeng, E. Arenholz, N. J. Podraza, M. Berghagen, R. Uecker, D. G. Schlom, V. Gopalan, L. Q. Chen, C. T. Chen, R. Ramesh, and Y. H. Chu, “Orthorhombic BiFeO3,” Physical Review Letters 109, 247606 (2012).
  64. Motyka, M. A., B. D. Gauntt, M. W. Horn, and N. J. Podraza, “Optical Properties and Microstructural Evolution of Vanadium Oxide Prepared by Pulsed-DC Magnetron Sputtering,” Journal of Applied Physics 112, 093504 (2012).
  65. Kim, S., M. A. Motyka, A. M. Palomino, and N. J. Podraza, “Conformal Effects of Absorbed Polymer on Swelling Behavior of Engineered Clay Soils,” Clays and Clay Minerals 60, 363 (2012).
  66. Ko, S. W., H. M. Schulze, D. Saint John, N. J. Podraza, and S. Trolier-McKinstry, “Low Temperature Crystallization of Metastable Nickel Manganite Spinel Thin Films,” Journal of the American Ceramic Society 95, 2562 (2012).
  67. Zurbuchen, M. A., N. J. Podraza, J. Schubert, Y. Jia, and D. G. Schlom, “Synthesis of the Superlattice Complex Oxide Sr5Bi4Ti8O27 and its Band Gap Behavior,” Applied Physics Letters 100, 223109 (2012).
  68. Podraza, N. J., B. D. Gauntt, M. A. Motyka, E. C. Dickey, and M. W. Horn, “Electrical and Optical Properties of Sputtered Amorphous Vanadium Oxide Thin Films,” Journal of Applied Physics 111, 073522 (2012).
  69. Shay, D., N. Podraza, N. Donnelly, and C. Randall, “High Energy Density, High Temperature Capacitors Utilizing Mn-Doped 0.8CaTiO3 – 0.2CaHfO3 Ceramics,” Journal of the American Ceramic Society 95, 1348 (2012).
  70. Collins, R. W., L. R. Dahal, N. J. Podraza, K. R. Kormanyos, and S. Marsillac, “Polarized Light Metrology for Thin Film Photovoltaics: Manufacturing Scale Processes,” Photovoltaics International 13, 129 (2011).
  71. Saint John, D. B., H.-B. Shin, M.-Y. Lee, S. K. Ajmera, A. J. Syllaios, E. C. Dickey, T. N. Jackson, and N. J. Podraza, “Influence of Microstructure and Composition on Hydrogenated Silicon Thin Film Properties for Uncooled Microbolometer Applications,” Journal of Applied Physics 110, 033714 (2011).
  72. Desireddy, A., C. P. Joshi, M. Sestak, S. Little, S. Kumar, N. J. Podraza, S. Marsillac, R. W. Collins, and T. P. Bigioni, “Wafer-Scale Self-Assembled Plasmonic Thin Films,” Thin Solid Films 519, 6077 (2011).
  73. Podraza, N. J., D. B. Saint John, S. W. Ko, H. M. Schulze, J. Li, E. C. Dickey, and S. Trolier-McKinstry, “Optical Properties of Solution Deposited Nickel Manganite Thin Films,” Thin Solid Films 519, 2919 (2011).
  74. Dahal, R. L., D. Sainju, N. J. Podraza, S. Marsillac, and R. W. Collins, “Real Time Spectroscopic Ellipsometry of Ag/ZnO and Al/ZnO Interfaces for Back-Reflectors in Thin Film Si:H Photovoltaics,” Thin Solid Films 519, 2682 (2011).
  75. Ko, S. W., J. Li, N. J. Podraza, E. C. Dickey, and S. Trolier-McKinstry, “Nickel Manganite Thermistor Films Deposited by Spin Spray for Microbolometer Applications,” Journal of the American Ceramic Society 94, 516 (2011).
  76. Ray Sloppy, J. D., N. J. Podraza, E. C. Dickey, and D. D. MacDonald, “Complex Dielectric Functions of Anodic Bi-Layer Tantalum Oxide,” Electrochemica Acta 55, 8751 (2010).
  77. Kumar, A., R. Zeches, S. Denev, N. J. Podraza, A. Melville, D. Schlom, R. Ramesh, and V. Gopalan, “Probing Mixed Phases and Monoclinic Distortion in Strained Bismuth Ferrite Films by Optical Second Harmonic Generation,” Applied Physics Letters 97, 112903 (2010).
  78. Yoon, H. P., Y. Yuwen, G. D. Barber, N. J. Podraza, J. M. Redwing, T. E. Mallouk, C. R. Wronski, and T. S. Mayer, “High Aspect Ratio Silicon Solar Cells,” Applied Physics Letters 96, 213503 (2010).
  79. Chen, P., N. J. Podraza, X. S. Xu, A. Melville, E. Vlahos, V. Gopalan, R. Ramesh, D. G. Schlom, and J. L. Musfeldt, “Optical Properties of Quasi-Tetragonal BiFeO3 Thin Films,” Applied Physics Letters 96, 131907 (2010).
  80. Podraza, N. J., J. Li, C. R. Wronski, E. C. Dickey, and R. W. Collins, “Analysis and Control of Mixed-Phase Amorphous+Microcrystalline Silicon Thin Films by Real Time Spectroscopic Ellipsometry,” Journal of Vacuum Science and Technology A 27, 1255 (2009).
  81. Kryukov, Y. A., N. J. Podraza, R. Collins, and J. G. Amar, “Experimental and Theoretical Study of the Evolution of Surface Roughness in Amorphous Silicon Films Grown by Low-Temperature Plasma-Enhanced Chemical Vapor Deposition,” Physical Review B 80, 085403 (2009).
  82. Ramirez, M. O., A. Kumar, S. A. Denev, N. Podraza, X. Xu, R. C. Rai, Y-H. Chu, J. Seidel, L. Martin, S-Y. Yang, E. Saiz, J. F. Ihlefeld, S. Lee, J. Klug, S. W. Cheong, M. J. Bedzyk, O. Auciello, D. G. Schlom, R. Ramesh, J. Orenstein, J. L. Musfeldt, and V. Gopalan, “Magnon Sidebands and Spin-Charge Coupling in Bismuth Ferrite Probed by Nonlinear Optical Spectroscopy,” Physical Review B 79, 224106 (2009).
  83. Lee, J. H., X. Ke, N. J. Podraza, L. Fitting Kourkoutis, T. Heeg, M. Roeckerath, J. W. Freeland, C. J. Fennie, J. Schubert, D. A. Muller, P. Schiffer, and D. G. Schlom, “Optical Band Gap and Magnetic Properties of Unstrained EuTiO3 Grown by Molecular-Beam Epitaxy,” Applied Physics Letters 94, 212509 (2009).
  84. Ramirez, M. O., A. Kumar, S. A. Denev, Y-H. Chu, J. Seidel, L. W. Martin, S-Y. Yang, R. C. Rai, X. S. Xue, J. F. Ihlefeld, N. J. Podraza, E. Saiz, S. Lee, J. Klug, S. W. Cheong, M. J. Bedzyk, O. Auciello, D. G. Schlom, J. Orenstein, R. Ramesh, J. L. Musfeldt, and V. Gopalan, “Spin-Charge-Lattice Coupling through Resonant Multimagnon Excitations in Multiferroic BiFeO3,” Applied Physics Letters 94, 161905 (2009).
  85. Podraza, N. J., S. M. Pursel, C. Chen, M. W. Horn, and R. W. Collins, “Analysis of the Optical Properties and Structure of Serial Bi-Deposited TiO2 Sculptured Thin Films using Mueller Matrix Ellipsometry,” Journal of Nano-Photonics 2, 021930 (2008).
  86. Kumar, A., N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y-H. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and Nonlinear Optical Properties of Multiferroic PbVO3 Thin Films,” Applied Physics Letters 92, 231915 (2008).
  87. Stoke, J. A., N. J. Podraza, J. Li, X. Cao, X. Deng, and R. W. Collins, " Advanced Deposition Phase Diagrams for Guiding Si:H-based Multijunction Solar Cells," Journal of Non-Crystalline Solids 354, 2435 (2008).
  88. Cao, X., J. A. Stoke, J. Li, N. J. Podraza, W. Du, X. Yang, D. Attygalle, X. Liao, R. W. Collins, and X. Deng, “Fabrication and Optimization of Single-junction nc-Si:H n-i-p Solar Cells using Si:H Phase Diagram Concepts Developed by Real Time Spectroscopic Ellipsometry,” Journal of Non-Crystalline Solids 354, 2397 (2008).
  89. Ihlefeld, J. F., N. J. Podraza, Z. K. Liu, R. C. Rai, X. Xu, T. Heeg, Y. B. Chen, J. Li, R. W. Collins, J. L. Musfeldt, X. Q. Pan, J. Schubert, R. Ramesh, and D. G. Schlom, “Optical Band Gap of BiFeO3 Grown by Molecular-Beam Epitaxy,” Applied Physics Letters 92, 142908 (2008)
  90. Kumar, A., R. Rai, N. J. Podraza, S. Denev, M. Ramirez, Y-H. Chu, L. W. Martin, J. F. Ihlefeld, T. Heeg, J. Schubert, D. G. Schlom, J. Orenstein, R. Ramesh, R. W. Collins, J. L. Musfeldt, and V. Gopalan, “Linear and Nonlinear Optical Properties of BiFeO3,” Applied Physics Letters 92, 121915 (2008).
  91. Marsillac, S., N. Barreau, H. Khatri, J. Li, D. Sainju, A. Parikh, N. J. Podraza, and R. W. Collins, “Spectroscopic Ellipsometry Studies of In2S3 Top Window and Mo Back Contacts in Chalcopyrite Photovoltaics Technology,” Physica Status Solidi c 5, 1244 (2008).
  92. Li, J., N. J. Podraza, and R. W. Collins, "Real Time Spectroscopic Ellipsometry of Sputtered CdTe, CdS, and CdTe1-xSx Thin Films for Photovoltaic Applications,” Physica Status Solidi a 205, 901 (2008).
  93. Podraza, N. J., J. Li, C. R. Wronski, E. C. Dickey, M. W. Horn, and R. W. Collins, “Analysis of Si1-xGex:H Thin Films with Graded Composition and Structure by Real Time Spectroscopic Ellipsometry,” Physica Status Solidi a 205, 892 (2008).
  94. Pearce, J. M., N. Podraza, R. W. Collins, M. M. Al-Jassim, K. M. Jones, J. Deng, and C. R. Wronski, “Optimization of Open-Circuit Voltage in Amorphous Silicon Solar Cells with Mixed Phase Amorphous-Nanocrystalline P-Contacts,” Journal of Applied Physics 101, 114301 (2007).
  95. Podraza, N. J., C. R. Wronski, and R. W. Collins, “Deposition Phase Diagrams for Si1-xGex:H from Real Time Spectroscopic Ellipsometry,” Journal of Non-Crystalline Solids, 352, 1263 (2006).
  96. Podraza, N. J., C. R. Wronski, and R. W. Collins, “Model for the Amorphous Roughening Transition in Amorphous Semiconductor Deposition,” Journal of Non-Crystalline Solids 352, 950 (2006).
  97. Podraza, N. J., C. Chen, I. An, G. M. Ferreira, P. I. Rovira, R. Messier and R. W. Collins, “Analysis of the Optical Properties and Structure of Sculptured Thin Films from Spectroscopic Mueller Matrix Ellipsometry,” Thin Solid Films 455, 571 (2004).
  98. Chen, C., I. An, G. M. Ferreira, N. J. Podraza, J. A. Zapien and R. W. Collins, “Multichannel Mueller Matrix Ellipsometer based on the Dual Rotating Compensator Principle,” Thin Solid Films 455, 14 (2004).

Conference and Symposium Proceedings

  1. # Poster Presentation – Ghimire, K., D. Zhao, AC. Wang, Y. Yan, and N. J. Podraza, “Optical Evaluation of Perovskite Films in and for Solar Cell Device Structures,” Proceedings of the 44th Photovoltaic Specialists Conference, in press (2017); presented by K. Ghimire at the IEEE 44th Photovoltaic Specialists Conference, Washington D.C., June 2017.
  2. # Poster Presentation – Subedi, I., T. J Silverman, M. Deceglie, and N. J. Podraza, “Impact of Infrared Optical Properties on Crystalline Si and Thin Film CdTe Solar Cells,” Proceedings of the 44th Photovoltaic Specialists Conference, in press (2017); presented by I. Subedi at the IEEE 44th Photovoltaic Specialists Conference, Washington D.C., June 2017.
  3. # Poster Presentation – Adhikari, D., M. M. Junda, S. X. Marsillac, R. W. Collins, and N. J. Podraza, “Magnetron Sputtered Hydrogenated Silicon Thin Films:  Assessment for Application in Photovoltaics,” Proceedings of the 44th Photovoltaic Specialists Conference, in press (2017); presented by D. Adhikari at the IEEE 44th Photovoltaic Specialists Conference, Washington D.C., June 2017.
  4. # Oral Presentation – Uprety, P., M. M. Junda, I. Subedi, M. A. Slocum, D. V. Forbes, S. M. Hubbard, and N. J. Podraza, “Electrical Transport Properties from Long Wavelength Ellipsometry,” Proceedings of the 44th Photovoltaic Specialists Conference, in press (2017); presented by P. Uprety at the IEEE 44th Photovoltaic Specialists Conference, Washington D.C., June 2017.
  5. # Oral Presentation – Junda, M. M., C. R. Grice, P. Koirala, R. W. Collins, Y. Yan, and N. J. Podraza, “Optical Properties of CdSe1-xSx and CdSe1-yTey Alloys and Their Application for CdTe Photovoltaics,” Proceedings of the 44th Photovoltaic Specialists Conference, in press (2017); presented by M. Junda at the IEEE 44th Photovoltaic Specialists Conference, Washington D.C., June 2017.
  6. ‡ Poster Presentation – Razooqi, M. A., A. B. Phillips, G. K. Liyanage, F. K. Al-Fadhili, M. M. Junda, N. J. Podraza, M. J. Heben, R. W. Collins, and P. Koirala, “Applications of Mapping Spectroscopic Ellipsometry for CdSe/CdTe and CdS/CdSe/CdTe Solar Cells:  Optimization of Low-Temperature Processed Devices with All-Sputtered Semiconductors,” Proceedings of the 44th Photovoltaic Specialists Conference, in press (2017); presented by M. A. Razooqi at the IEEE 44th Photovoltaic Specialists Conference, Washington D.C., June 2017.
  7. ‡ Poster Presentation – Rajan, G., T. Miryala, S. Karki, R. W. Collins, N. J. Podraza, and S. X. Marsillac,, “Influence of Deposition Parameters on Silicon Thin Films Deposited by Magnetron Sputtering,” Proceedings of the 44th Photovoltaic Specialists Conference, in press (2017); presented by G. Rajan at the IEEE 44th Photovoltaic Specialists Conference, Washington D.C., June 2017.
  8. # Oral Presentation – Ghimire, K., D. Zhao, A. Cimaroli, W. Ke, M. Junda, Y. Yan, and N. J. Podraza, “Optical Properties and Degradation Monitoring of CH3NH3PbI3,” Proceedings of the 43rd Photovoltaic Specialists Conference, 89-94  (2016); presented by K. Ghimire at the IEEE 43rd Photovoltaic Specialists Conference, Portland, OR, June 2016.
  9. ‡ Oral Presentation – Ibdah, A.-R., P. Pradhan, P. Aryal, J. Li, N. J. Podraza, and R. W. Collins, “High Speed Mapping of Ga Compositional Profiles in CuIn1-xGaxSe2 Solar Cells by Spectroscopic Ellipsometry,” Proceedings of the 43rd Photovoltaic Specialists Conference, 3391-3395 (2016); presented by P. Pradhan at the IEEE 43rd Photovoltaic Specialists Conference, Portland, OR, June 2016.
  10. ‡ Poster Presentation – Ibdah, A.-R., P. Pradhan, P. Aryal, N. J. Podraza, S. Marsillac, and R. W. Collins, “CuIn1-xGaxSe2 Solar Cells with Thin Absorbers Analyzed by Spectroscopic Ellipsometry:  Insights into Quantum Efficiency and Optical/Collection Losses,” Proceedings of the 43rd Photovoltaic Specialists Conference, 2184-2187 (2016); presented by P. Pradhan at the IEEE 43rd Photovoltaic Specialists Conference, Portland, OR, June 2016.
  11. ‡ Poster Presentation – Rajan, G., T. Begou, K. Aryal, T. Ashrafee, S. Karki, V. Ranjan, A. A. Rockett, N. J. Podraza, R. W. Collins, and S. Marsillac, “Optimization of Multi-layered Anti-reflective Coatings for Ultra-thin Cu(In,Ga)Se2 Solar Cells,” Proceedings of the 43rd Photovoltaic Specialists Conference, 1506-1510 (2016); presented by G. Rajan at the IEEE 43rd Photovoltaic Specialists Conference, Portland, OR, June 2016.
  12. Oral Presentation – Ghimire, K., A. Cimaroli, F. Hong, T. Shi, N. J. Podraza, and Y. Yan “Spectroscopic Ellipsometry Studies of CH3NH3PbX3 Thin Films and their Growth Evolution,” Proceedings of the 42nd Photovoltaic Specialists Conference, 1-5 (2015); presented by N. J. Podraza at the IEEE 42nd Photovoltaic Specialists Conference, New Orleans, LA, June 2015.
  13. ‡ Oral Presentation – Li, J., P. Pradhan, P. Koirala, X. Tan, B. Sang, B. J. Stanbery, N. J. Podraza, and R. W. Collins “Through-the-Glass Spectroscopic Ellipsometry for Simultaneous Mapping of Coating Properties and Stress in the Glass,” Proceedings of the 42nd Photovoltaic Specialists Conference, 1-4 (2015); presented by P. Pradhan at the IEEE 42nd Photovoltaic Specialists Conference, New Orleans, LA, June 2015.
  14. ‡ Poster Presentation – Pradhan, P., P. Aryal, A.-R. Ibdah, P. Koirala, J. Li, N. J. Podraza, A. A. Rockett, S. Marsillac, and R. W. Collins “Effect of Molybdenum Deposition Temperature on the Performance of CuIn1-xGaxSe2 Solar Cells,” Proceedings of the 42nd Photovoltaic Specialists Conference, 1-4 (2015); presented by P. Pradhan at the IEEE 42nd Photovoltaic Specialists Conference, New Orleans, LA, June 2015.
  15. ‡ Poster Presentation – Aryal, P., P. Pradhan, Z. Huang, S. Marsillac, N. J. Podraza, and R. W. Collins “Quantum Efficiency Simulations with Inputs from Spectroscopic Ellipsometry for Evaluation of Carrier Collection in a-Si:H Solar Cells,” Proceedings of the 42nd Photovoltaic Specialists Conference, 1-4 (2015); presented by P. Pradhan at the IEEE 42nd Photovoltaic Specialists Conference, New Orleans, LA, June 2015.
  16. ‡ Poster Presentation – Koirala, P., X. Tan, J. Li, N. J. Podraza, S. Marsillac, A. Rockett, and R. W. Collins “Mapping Spectroscopic Ellipsometry of CdTe Solar Cell Processes: Optimization of Cu Incorporation for Different CdS/CdTe Thicknesses,” Proceedings of the 40th Photovoltaic Specialists Conference, 674 (2014); presented by P. Koirala at the IEEE 40th Photovoltaic Specialists Conference, Denver, CO, June 2014.
  17. ‡ Oral Presentation – Pradhan, P., P. Aryal, A.-R. Ibdah, K. Aryal, J. Li, N. J. Podraza, S. Marsillac, and R. W. Collins “Real Time Spectroscopic Ellipsometry Analysis of the Three-Stages of CuIn1-xGaxSe2 co-Evaporation,” Proceedings of the 40th Photovoltaic Specialists Conference, 2060 (2014); presented by P. Pradhan at the IEEE 40th Photovoltaic Specialists Conference, Denver, CO, June 2014.
  18. ‡ Poster Presentation – Koirala, P., Z. Huang, X. Tan, M. Junda, N. J. Podraza, S. Marsillac, A. Rockett, and R. W. Collins “Doped a-Si1-xCx:H as a Novel Back Contact Material for CdTe Solar Cells,” Proceedings of the 40th Photovoltaic Specialists Conference, 2354 (2014); presented by P. Koirala at the IEEE 40th Photovoltaic Specialists Conference, Denver, CO, June 2014.
  19. ‡ Oral Presentation – Basantani, H., D. B. Saint John, N. J. Podraza, T. N. Jackson, and M. W. Horn, “Evaluation of 1/f Noise in Prospective IR Imaging Thin Films,” SPIE Proceedings: Infrared Technology and Applications 9070, 9070IP (2014); presented by H. Basanti at the SPIE: Defense, Security, and Sensing in Baltimore, MD, May 2014.
  20. ‡ Poster Presentation – Pradhan, P., D. Attygale, P. Aryal, N. J. Podraza, A. S. Ferlauto, S. Marsillac, and R. W. Collins, “Real Time Spectroscopic Ellipsometry of First Stage CuIn1-xGaxSe2: Indium-Gallium Selenide co-Evaporation,” Proceedings of the 39th Photovoltaic Specialists Conference, 0414 (2013); presented by P. Aryal at the IEEE 39th Photovoltaic Specialists Conference, Tampa, FL, June 2013.
  21. Poster Presentation – Karki Gautam, L., and N. J. Podraza, “Growth Evolution of Si:H Prepared with SiH4 + Si2H6 as Studied by Real Time Spectroscopic Ellipsometry,” Proceedings of the 39th Photovoltaic Specialists Conference, 0605 (2013); presented by N. J. Podraza at the IEEE 39th Photovoltaic Specialists Conference, Tampa, FL, June 2013.
  22. Invited Oral Presentation – Collins, R. W., D. Attygalle, P. Aryal, P. Pradhan, A. R. A. Ibdah, N. J. Podraza, K. Aryal, V. Ranjan, and S. Marsillac, “Real Time, In-Line, and Mapping Spectroscopic Ellipsometry for Applications in CuIn1-xGaxSe2 Metrology,” Proceedings of the 39th Photovoltaic Specialists Conference, 1685 (2013); presented by R. W. Collins at the IEEE 39th Photovoltaic Specialists Conference, Tampa, FL, June 2013.
  23. Oral Presentation – Huang, Z., A. S. Ferlauto, N. J. Podraza, and R. W. Collins, “Optimization of a-Si:H p-i-n Solar Cells Through Development of n-layer Growth Evolution Diagram and Large Area Mapping,” Proceedings of the 39th Photovoltaic Specialists Conference, 1788 (2013); presented by R. W. Collins at the IEEE 39th Photovoltaic Specialists Conference, Tampa, FL, June 2013.
  24. ‡ Poster Presentation – Koirala, P., J. Chen, X. Tan, N. J. Podraza, S. Marsillac, A. A. Rockett, and R. W. Collins, “Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: From Real Time Monitoring to Large-Scale Mapping,” Proceedings of the 39th Photovoltaic Specialists Conference, 1987 (2013); presented by P. Koirala at the IEEE 39th Photovoltaic Specialists Conference, Tampa, FL, June 2013.
  25. ‡ Poster Presentation – Shen, H., Y. Yuwen, X. Wang, J. I. Ramirez, Y. V. Li, Y. Ke, C. E. Kendrick, N. J. Podraza, T. N. Jackson, E. C. Dickey, T. S. Mayer, and J. M. Redwing, “Effect of c-Si Doping Density on Heterojunction with Intrinsic Thin Layer (HIT) Radial Junction Solar Cells,” Proceedings of the 39th Photovoltaic Specialists Conference, 2466 (2013); presented by H. Shen at the IEEE 39th Photovoltaic Specialists Conference, Tampa, FL, June 2013.
  26.  # Oral Presentation – Saint John, D. B., H. Shen, H.-B. Shin, T. N. Jackson, and N. J. Podraza, “Infrared Dielectric Functions of Hydrogenated Amorphous Silicon Thin Films Determined by Spectroscopy Ellipsometry,” Proceedings of the 38th Photovoltaic Specialists Conference, 003112 (2012); presented by D. B. Saint John at the IEEE 38th Photovoltaic Specialists Conference, Austin, TX, June 2012.
  27. Poster Presentation – Podraza, N. J., and D. B. Saint John, “Optical Characterization of Structurally Graded Si1-xGex:H Thin Films,” Proceedings of the 38th Photovoltaic Specialists Conference, 000354 (2012); presented by N. J. Podraza at the IEEE 38th Photovoltaic Specialists Conference, Austin, TX, June 2012.
  28. ‡ Poster Presentation – Banai, R., H. Lee, M. Lwinsohn, M. Motyka, R. Chandrasekharan, N. Podraza, J. R. S. Brownson, and M. Horn, “Investigation of the Absorption Properties of Sputtered Tin Monosulfide Thin Films for Photovoltaic Applications,” Proceedings of the 38th Photovoltaic Specialists Conference, 000164 (2012); presented by R. Banai at the IEEE 38th Photovoltaic Specialists Conference, Austin, TX, June 2012.
  29. ‡ Poster Presentation – Koirala, P., N. Paudel, J. Chen, P. Pradhan, D. Attygalle, Y. Yan, N. J. Podraza, and R. W. Collins, “Real Time and Post-Deposition Optical Analysis of Interfaces in CdTe Solar Cells,” Proceedings of the 38th Photovoltaic Specialists Conference, 000134 (2012); presented by P. Koirala at the IEEE 38th Photovoltaic Specialists Conference, Austin, TX, June 2012.
  30. ‡ Poster Presentation – Khanal, R. R., A. B. Philips, Z. Huang, L. R. Dahal, N. Podraza, R. W. Collins, and M. J. Heben, “Hydrogenated Amorphous Silicon (a-Si:H) and Single Wall Carbon Nanotube (SWNT) Heterojunction Solar Cell,” Proceedings of the 38th Photovoltaic Specialists Conference, 000057 (2012); presented by R. R. Khanal at the IEEE 38th Photovoltaic Specialists Conference, Austin, TX, June 2012.
  31. ‡ Oral Presentation – Kim, S., A. M. Palomino, and N. J. Podraza, “Characterization of Absorbed Polymer Conformal Response Using Spectroscopic Ellipsometry,” ACSE Geo-Institute GeoCongress 2012, 1136 (2012); presented by S. Kim at the Geo-Institute’s 2012 Annual Congress, Oakland, CA, March 2012.
  32. ‡ Oral Presentation – Dahal, L. R., Z. Huang, C. Salupo, N. J. Podraza, S. Marsillac, and R. W. Collins, “Mapping Amorphous Silicon p-type Layers in Roll-to-Roll Deposition: Toward Spatially Resolved PECVD Phase Diagrams,” Proceedings of the 37th Photovoltaic Specialists Conference, 000182 (2011); presented by L. R. Dahal at the IEEE 37th Photovoltaic Specialists Conference, Seattle, WA, June 2011.
  33. Poster Presentation – Yoon, H., Y. Yuwen, H. Shen, N. Podraza, T. Mallouk, E. Dickey, J. Redwing, C. Wronski, and T. Mayer, “Parametric Study of Micropillar Array Solar Cells,” Proceedings of the 37th Photovoltaic Specialists Conference, 000303 (2011); presented by H. Yoon at the IEEE 37th Photovoltaic Specialists Conference, Seattle, WA, June 2011.
  34. Invited Oral Presentation – Werner, D. H., T. S. Mayer, C. Rivero-Baleine, N. J. Podraza, K. Richardson, J. Turpin, A. Pogrebnyakov, J. D. Musgraves, J. A. Bossard, H. J. Shin, R. Muise, S. Rogers, and J. D. Johnson, “Adaptive Phase Change Metamaterials for Infrared Aperture Control,” SPIE Proceedings: Optical Engineering + Applications 8165, 81651H (2011); presented by D. H. Werner at the SPIE: Optics + Photonics in San Diego, CA, August 2011.
  35. Oral Presentation – Saint John, D. B., H.-B. Shin, M.-Y. Lee, E. C. Dickey, N. J. Podraza, and T. N. Jackson, “Thin Film Silicon and Germanium for Uncooled Microbolometer Applications,” SPIE Proceedings: Infrared Technology and Applications 8012, 80123U (2011); presented by N. J. Podraza at the SPIE: Defense, Security, and Sensing in Orlando, FL, April 2011.
  36. Oral Presentation – Gauntt, B. D., J. Li, O. M. Cabarcos, H. A. Basantani, C. Venkatrasubramanian, S. S. N. Bharadwaja, N. J. Podraza, T. N. Jackson, D. L. Allara, S. Antrazi, M. W. Horn, and E. C. Dickey, “Microstructure of Vanadium Oxide Used in Microbolometers,” SPIE Proceedings: Infrared Technology and Applications 8012, 80123T (2011); presented by O. M. Cabarcos at the SPIE: Defense, Security, and Sensing in Orlando, FL, April 2011.
  37. Oral Presentation - Podraza, N. J., D. Saint John, J. Li, C. R. Wronski, E. C. Dickey, and R. W. Collins, “Microstructural Evolution in Si1-xGex:H Thin Films for Photovoltaic Applications,” Proceedings of the 35th Photovoltaic Specialists Conference, 000158 (2010); presented by N. J. Podraza at the IEEE 35th Photovoltaic Specialists Conference, Honolulu, HI, June 2010.
  38. ‡ Oral Presentation - Dahal, L. R., D. Sainju, J. Li, N. J. Podraza, M. N. Sestak, and R. W. Collins, “Comparison of Al/ZnO and Ag/ZnO Interfaces of Back-Reflectors for Thin Film Si:H Photovoltaics,” Proceedings of the 34th Photovoltaic Specialists Conference, 001702 (2009); Presented by L. R. Dahal at the IEEE 34th Photovoltaic Specialists Conference in Philadelphia, PA, May 2009.
  39. ‡ Oral Presentation - Dahal, L. R., D. Sainju, J. Li, J. A. Stoke, N. J. Podraza, X. Deng, and R. W. Collins, “Plasmonic Characteristics of Ag/ZnO Back-Reflectors for Thin Film Si Photovoltaics,” Proceedings of the 33rd Photovoltaic Specialists Conference, 502 (2008); presented by L. R. Dahal at the IEEE 33rd Photovoltaic Specialists Conference in San Diego, CA, May 2008.
  40. ‡ Oral Presentation - Stoke, J. A., L. R. Dahal, J. Li, N. J. Podraza, X. Cao, X. Deng, and R. W. Collins, “Optimization of Si:H Multijunction n-i-p Solar Cells through the Development of Deposition Phase Diagrams,” Proceedings of the 33rd Photovoltaic Specialists Conference, 762 (2008); presented by J. A. Stoke at the IEEE 33rd Photovoltaic Specialists Conference in San Diego, CA, May 2008.
  41. Oral Presentation - Podraza, N. J., J. Li, C. R. Wronski, M. W. Horn, E. C. Dickey and R. W. Collins, “Analysis of Compositionally and Structurally Graded Si:H and Si1-xGex:H by Real Time Spectroscopic Ellipsometry,” Materials Research Society Symposia Proceedings 1066, A.10.1.1 (2008); presented by N. J. Podraza at the 2008 Materials Research Society Spring Meeting in San Francisco, CA, March 2008.
  42. * Invited Oral Presentation - Li, J., J. A. Stoke, N. J. Podraza, D. Sainju, A. Parikh, X. Cao, H. Khatri, N. Barreau, S. Marsillac, X. Deng, and R. W. Collins, “Analysis and Optimization of Thin Film Photovoltaic Materials and Device Fabrication by Real Time Spectroscopic Ellipsometry,” SPIE Proceedings: Photovoltaic Cell and Module Technologies 6651, 665107 (2007); presented by R. W. Collins at the SPIE: Optics + Photonics in San Diego, CA, August 2007.
  43. * Oral Presentation - Stoke, J. A., N. J. Podraza, J. Li, X. Cao, X. Deng, and R. W. Collins, “Advanced Deposition Phase Diagrams for Guiding Si:H-based Multijunction Solar Cells,” Materials Research Society Symposia Proceedings 989, A.15.2.1 (2007); presented by R. W. Collins at the 2007 Materials Research Society Spring Meeting in San Francisco, CA, April 2007.
  44. * Oral Presentation - Sainju, D., P. J. van den Oever, N. J. Podraza, M. Syed, J. A. Stoke, J. Chen, X. Yang, X. Deng, and R. W. Collins, “Origin of Optical Losses in Ag/ZnO Back-Reflectors for Thin Film Si Photovoltaics,” Proceedings of the 4th World Conference on Photovoltaic Energy Conversion, 1732 (2006); presented by R. W. Collins at the IEEE 4th World Conference on Photovoltaic Energy Conversion in Waikoloa, HI, May 2006.
  45. Poster Presentation - Podraza, N. J., C. R. Wronski, M. W. Horn, and R. W. Collins, “Roughness and Phase Evolution in Si1-xGex:H: Guidance for Multijunction Photovoltaics,” Proceedings of the 4th World Conference on Photovoltaic Energy Conversion, 1657 (2006); presented by N. J. Podraza at the IEEE 4th World Conference on Photovoltaic Energy Conversion in Waikoloa, HI, May 2006.
  46. † Poster Presentation - Chen, J., J. Li, D. Sainju, K. D. Wells, N. J. Podraza, and R. W. Collins, “Multilayer Analysis of the CdTe Solar Cell Structure by Spectroscopic Ellipsometry,” Proceedings of the 4th World Conference on Photovoltaic Energy Conversion, 475 (2006); presented by J. Li at the IEEE 4th World Conference on Photovoltaic Energy Conversion in Waikoloa HI, May 2006.
  47. † Oral Presentation - Li, J., J. Chen, N. J. Podraza, and R. W. Collins, “Real Time Spectroscopic Ellipsometry of Sputtered CdTe: Effect of Growth Temperature on Structural and Optical Properties,” Proceedings of the 4th World Conference on Photovoltaic Energy Conversion, 392 (2006); presented by J. Li at the IEEE 4th World Conference on Photovoltaic Energy Conversion in Waikoloa HI, May 2006.
  48. Oral Presentation - Podraza, N. J., C. R. Wronski, M. W. Horn, and R. W. Collins, “Surface Roughening Transitions in Si1-xGex:H Thin Films,” Materials Research Society Symposia Proceedings 910, A.03.2.1 (2006); presented by N. J. Podraza at the 2006 Materials Research Society Spring Meeting in San Francisco, CA, April 2006.
  49. Poster Presentation - Podraza, N. J., C. R. Wronski, M. W. Horn, and R. W. Collins, “Dielectric functions of a-Si1-xGex:H vs. Ge content, Temperature, and Processing: Advances in Optical Function Parameterization,” Materials Research Society Symposia Proceedings 910, A.10.1.1 (2006); presented by N.J. Podraza at the 2006 Materials Research Society Spring Meeting in San Francisco, CA, April 2006.
  50. Poster Presentation - Podraza, N. J., C. Chen, D. Sainju, O. Ezekoye, M. W. Horn, C. R. Wronski, and R. W. Collins, “Transparent Conducting Oxide Sculptured Thin Films for Photovoltaic Applications,” Materials Research Society Symposia Proceedings 865, F.7.1.1 (2005); presented by N. J. Podraza at the 2005 Materials Research Society Spring Meeting in San Francisco, CA, April 2005.
  51. † Oral Presentation - Li, J., J. Chen, J. A. Zapien, N. J. Podraza, C. Chen, J. Drayton, A. Vasko, A. Gupta, S. L. Wang, R. W. Collins, and A. D. Compaan, “Real Time Analysis of Magnetron-Sputtered Thin-Film CdTe by Multichannel Spectroscopic Ellipsometry,” Materials Research Society Symposia Proceedings 865, F.1.2.1 (2005); presented by J. Li at the 2005 Materials Research Society Spring Meeting in San Francisco, CA, April 2005.
  52. Oral Presentation - Podraza, N. J., G. M. Ferreira, C. R. Wronski, and R. W. Collins, “Development of Deposition Phase Diagrams for Thin Film Si:H and Si1-xGex:H Using Real Time Spectroscopic Ellipsometry,” Materials Research Society Symposia Proceedings 862, A.16.3.1 (2005); presented by N. J. Podraza at the 2005 Materials Research Society Spring Meeting in San Francisco, CA, April 2005.
  53. † Oral Presentation - Chen, C., C. Ross, N. J. Podraza, C. R. Wronski, and R. W. Collins, “Multichannel Mueller Matrix Analysis of the Evolution of Microscopic Roughness and Texture during ZnO:Al Chemical Etching,” Proceedings of the 31st Photovoltaic Specialists Conference, 1524 (2005); presented by C. Chen at the IEEE 31st Photovoltaic Specialists Conference in Orlando, FL, January 2005.
  54. † Oral Presentation - Podraza, N. J., C. Chen, J. M. Flores, D. Sainju, I. An, G. M. Ferreira, C. R. Wronski, M. W. Horn, R. Messier, and R. W. Collins, “Optical Properties of Transparent Conducting Oxide Sculptured Thin Films for Applications in Thin Film Silicon Photovoltaics,” Proceedings of the 31st Photovoltaic Specialists Conference, 1428 (2005); presented by C. Chen at the IEEE 31st Photovoltaic Specialists Conference in Orlando, FL, January 2005.
  55. Oral Presentation - Podraza, N. J., G. M. Ferreira, M. L. Albert, C. Chen, C. R. Wronski, and R. W. Collins, “Real Time Spectroscopic Ellipsometry of Thin Film Si1-xGex:H: Phase Diagrams for Optimization in Photovoltaics Applications,” Proceedings of the 31st Photovoltaic Specialists Conference, 1393 (2005); presented by N. J. Podraza at the IEEE 31st Photovoltaic Specialists Conference in Orlando, FL, January 2005.
  56. * Oral Presentation - Zapien, J. A, J. Chen, J. Li, J. Inks, N. J. Podraza, C. Chen, J. Drayton, A. Vasko, A. Gupta, S. L. Wang, R. W. Collins, and A. D. Compaan, “Real Time Spectroscopic Ellipsometry of Thin Film CdTe Deposition by Magnetron Sputtering for Photovoltaic Applications,” Proceedings of the 31st Photovoltaic Specialists Conference, 461 (2005); presented by R. W. Collins at the IEEE 31st Photovoltaic Specialists Conference in Orlando, FL, January 2005.

Conference Presentations with Abstract Only

  1. Oral Presentation – Podraza, N. J., K. Ghimire, P. Uprety, and M. Junda, “Analysis Procedures for Multiple Sets of Ellipsometric Spectra,” presented by N. Podraza at the 44th International Conference on Metallurgical Coatings and Thin Films, San Diego, CA, April 2017.
  2. Invited Oral Presentation – Ghimire K., M. M. Junda, P. Koirala, P. Pradhan, A. A. Ibdah, S. Marsillac, R. W. Collins, Y. Yan, and N. J. Podraza, “Optical Monitoring of Growth (and Death) of Thin Film Materials for Solar Cells,” presented by N. J. Podraza at the 63rd American Vacuum Society International Symposium and Exhibition, Nashville, TN, November 2016.
  3. # Oral Presentation – Junda, M. M., C. R. Grice, Y. Yan, and N. J. Podraza, “Spectroscopic Ellipsometry Studies of CdS-CdSe-CdTe Alloys:  Applications in Thin Film Solar Cells,” presented by M. M. Junda at the 63rd American Vacuum Society International Symposium and Exhibition, Nashville, TN, November 2016.
  4. # Oral Presentation – Uprety, P., M. M. Junda, K. Lambright, R. Khanal, A. Phillips, M. Heben, D. M. Giolando, and N. J. Podraza, “Optical Determination of Electrical Response for Thin Film Transparent Conductors:  Spectral Range Dependence,” presented by P. Uprety at the 63rd American Vacuum Society International Symposium and Exhibition, Nashville, TN, November 2016.
  5. # Oral Presentation – Adhikari, D., M. M. Junda, and N. J. Podraza, “Development of Growth Evolution Diagrams for RF Sputtered Nanocrystalline Hydrogenated Silicon Thin Films via Real Time Spectroscopic Ellipsometry,” presented by D. Adhikari at the 63rd American Vacuum Society International Symposium and Exhibition, Nashville, TN, November 2016.
  6. Invited Oral Presentation – Podraza, N. J., K. Ghimire, M. M. Junda, I. Subedi, A. A. Ibdah, P. Koirala, S. Marsillac, R. W. Collins, and Yanfa Yan, “Thin Film Solar Cells:  Monitoring Growth, Degradation, and Devices,” presented by N. Podraza at the 7th International Conference on Spectroscopic Ellipsometry, Berlin, Germany, June 2016.
  7. # Invited Oral Presentation – Junda, M. M., C. R. Grice, I. Subedi, X. Tan,  R. W. Collins, Yanfa Yan, and N. J. Podraza, “Effects of Oxygen Partial Pressure, Deposition Temperature, and Annealing on the Optical Response of CdS:O Thin Films,” presented by M. M. Junda at the 7th International Conference on Spectroscopic Ellipsometry, Berlin, Germany, June 2016.
  8. Oral Presentation – Koirala, P., A. Ibdah, P. Aryal, P. Pradhan, S. Marsillac, A. A. Rockett, N. J. Podraza, and R. W. Collins, “Spectroscopic Ellipsometry for Analysis of Polycrystalline Thin-Film Photovoltaic (PV) Devices and Prediction of External Quantum Efficiency,” presented by N. Podraza at the 7th International Conference on Spectroscopic Ellipsometry, Berlin, Germany, June 2016.
  9. # Oral Presentation – Subedi, I., K. P. Bhandari, R. J. Ellingson, and N. J. Podraza, “Near Infrared to Ultraviolet Optical Properties of Single Crystal and Nanocrystal Thin Film Iron Pyrite,” presented by I. Subedi at the 7th International Conference on Spectroscopic Ellipsometry, Berlin, Germany, June 2016.
  10. ‡ Oral Presentation – Brakstad, T., B. R. Hope, M. Nematolahi, M. Kildemo, N. J. Podraza, K. Ghimire, and T. W. Reenaas, “Ellipsometric Study of the Optical Response of ZnS:Cr for PV Applications,” presented by T. Brakstad at the 7th International Conference on Spectroscopic Ellipsometry, Berlin, Germany, June 2016.
  11. Oral Presentation – Losurdo, M., M. M. Junda, M. M. Giangregorio, N. J. Podraza, R. W. Collins, and A. S. Brown, “THz to IR and UV Ellipsometry:  Revealing Behavior of Si-Supported Gallium Plasmonic Nanoparticles,” presented by M. Losurdo at the 7th International Conference on Spectroscopic Ellipsometry, Berlin, Germany, June 2016.
  12. # Poster Presentation – Subedi, I., M. Slocum, D. Forbes, S. Hubbard, and N. J. Podraza, “Optical Properties of InP from the Infrared to Vacuum Ultraviolet by Spectroscopic Ellipsometry,” presented by I. Subedi at the 7th International Conference on Spectroscopic Ellipsometry, Berlin, Germany, June 2016.
  13. # Poster Presentation – Uprety, P., M. M. Junda, K. Ghimire,  and N. J. Podraza, “Spectroscopic Ellipsometry Determination of Optical and Electrical Properties of Aluminum Doped Zinc Oxide,” presented by M. M. Junda at the 7th International Conference on Spectroscopic Ellipsometry, Berlin, Germany, June 2016.
  14. # Poster Presentation – Junda, M. M., L. Karki Gautam, R. W. Collins, and N. J. Podraza, “Optical Property Gradients in a-Si:H Thin Films Studied by Virtual Interface Analysis of Real Time Spectroscopic Ellipsometry,” presented by M. M. Junda at the 7th International Conference on Spectroscopic Ellipsometry, Berlin, Germany, June 2016.
  15. Oral Presentation – Huang, H., L. R. Dahal, M. M. Junda, P. Aryal, S. Marsillac, R. W. Collins, and N. J. Podraza, “Characterization of Structure and Growth Evolution for nc-Si:H in the Tandem Photovoltaic Device Configuration,” presented by N. J. Podraza at the IEEE 42nd Photovoltaic Specialists Conference, New Orleans, LA, June 2015.
  16. Invited Oral Presentation – Podraza, N. J., “Impact of Optical and Electrical Properties on Performance of Hydrogenated Silicon Based Photovoltaic and Microbolometer Devices,” to be presented by N. J. Podraza at the Glass & Optical Materials Division and Deutsche Glastechnische Gesellschaft Joint Annual Meeting 2015, Miami, FL, May 2015.
  17. Invited Oral Presentation – Podraza, N. J., “Spectroscopic Ellipsometry Applied Toward Photovoltaics Manufacturing,” to be presented by N. J. Podraza at the European Materials Research Society Spring Meeting, Lille, France, May 2015.
  18. # Oral Presentation – Karki Gautam, L., M. M. Junda, H. F. Haneef, R. W. Collins, and N. J. Podraza, “Spectroscopic Ellipsometry Studies of n-i-p Hydrogenated Amorphous Silicon Based Photovoltaic Devices,” presented by L. Karki Gautam at the 42nd International Conference on Metallurgical Coatings and Thin Films, San Diego, CA, April 2015
  19. # Poster Presentation – Junda, M. M., L. Karki Gautam, R. W. Collins, and N. J. Podraza, “Spectroscopic Ellipsometry Studies of Amorphous Silicon Based Photovoltaic Devices,” presented by M. M. Junda at the American Vacuum Society 61st International Symposium, Baltimore, MD, November 2014.
  20. # Oral Presentation – Ghimire, K., H. Haneef, and N. J. Podraza, “Infrared to Ultraviolet Optical Properties of Gadolinium Gallium Garnet (Gd3Ga5O12) and Bismuth Germanate (Bi4Ge3O12) Single Crystals,” presented by K. Ghimire at the American Vacuum Society 61st International Symposium, Baltimore, MD, November 2014.
  21. # Oral Presentation – M. M. Junda, K. Ghimire, A. Barnes, L. Karki Gautam, and N. J. Podraza, “Combined Optical Emission Spectroscopy and Spectroscopic Ellipsometry Collected During Thin Film Deposition,” to be presented by M. M. Junda at the American Vacuum Society 61st International Symposium, Baltimore, MD, November 2014.
  22. # Oral Presentation – Tan, X., P. Koirala, J. Li, N. J. Podraza, and R. W. Collins, “Real-Time and Through-the-Glass Mapping Spectroscopic Ellipsometry for Analysis and Optimization of CdS:O Window Layers of CdTe Superstrate Solar Cells,” presented by X. Tan at the American Vacuum Society 61st International Symposium, Baltimore, MD, November 2014.
  23. Invited Oral Presentation – Junda, M. M., L. R. Dahal, P. Koirala, D. Attygalle, P. Aryal, P. Pradhan, C. Salupo, D. Saint John, R. W. Collins, and N. J. Podraza, “Spectroscopic Characterization in the Photovoltaic Device Configuration,” presented by N. J. Podraza at the American Vacuum Society 61st International Symposium, Baltimore, MD, November 2014.
  24. # Oral Presentation – Junda, M. M., R. W. Collins, and N. J. Podraza, “Spectroscopic Ellipsometry Applied in the Full p-i-n a-Si:H Solar Cell Device Configuration,” presented by M. M. Junda at the IEEE 40th Photovoltaic Specialists Conference, Denver, CO, June 2014.
  25. Invited Oral Presentation – Podraza, N. J., “Spectroscopic Characterization in the Photovoltaic Device Configuration,” presented by N. J. Podraza at the 41st International Conference on Metallurgical Coatings and Thin Films, San Diego, CA, May 2014.
  26. Invited Oral Presentation – Podraza, N. J., “Material Characterization by Spectroscopic Ellipsometry: Exploiting the Optical Response of Matter,” presented by N. J. Podraza at PITTCON 2014 Conference and Exhibition, Chicago, IL, March 2014.
  27. ‡ Oral Presentation – Shan, A., M. Fried, G. Juhasz, C. Major, O. Polgar, A. Nemeth, P. Petrik, L. R. Dahal, J. Chen, Z. Huang, N. J. Podraza, and R. W. Collins, “High-Speed Imaging / Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin Film Photovoltaics,” presented by A. Shan at the IEEE 39th Photovoltaic Specialists Conference, Tampa, FL, June 2013.
  28. ‡ Oral Presentation – Aryal, P., D. Attygalle, P. Pradhan, A. R. A. Ibdah, K. Aryal, , N. J. Podraza, S. Marsillac, A. A. Rockett, and R. W. Collins, “Correlations Between Mapping Spectroscopic Ellipsometry and Solar Cell Performance for the Study of Nonuniformities in Thin (0.7 mm) CuIn1-xGaxSe2 Solar Cells over Large-Areas,” presented by P. Aryal at the IEEE 39th Photovoltaic Specialists Conference, Tampa, FL, June 2013.
  29. Poster Presentation – Saint John, D. B., and N. J. Podraza, “Optical Determination of Resistivity in Thin Metal Films using Parameterized Complex Dielectric Function Spectra,” presented by N. J. Podraza at the 6th International Conference on Spectroscopic Ellipsometry, Kyoto, Japan, May 2013.
  30. Poster Presentation – Dahal, L. R., Z. Huang, C. Salupo, N. J. Podraza, and R. W. Collins, “Real Time Spectroscopic Ellipsometry for Analysis and Optimization of Thin Film Silicon Solar Cells by Roll-to-Roll Fabrication,” presented by R. W. Collins at the 6th International Conference on Spectroscopic Ellipsometry, Kyoto, Japan, May 2013.
  31. Poster Presentation – Ramanujam, B., J. Chen, N. J. Podraza, and R. W. Collins, “Analysis of Non-Idealities in Rhomb Compensators,” presented by R. W. Collins at the 6th International Conference on Spectroscopic Ellipsometry, Kyoto, Japan, May 2013.
  32. Oral Presentation – Koirala, P., D. Attygalle, P. Aryal, P. Pradhan, J. Chen, S. Marsillac, A. S. Ferlauto, N. J. Podraza, and R. W. Collins, “Real Time Spectroscopic Ellipsometry for Analysis and Control of Thin Polycrystalline Semiconductor Deposition in Photovoltaics,” presented by N. J. Podraza at the 6th International Conference on Spectroscopic Ellipsometry, Kyoto, Japan, May 2013.
  33. Poster Presentation – Podraza, N. J., L. Karki Gautam, M. Junda, H. Haneef, L. Ye, and D. B. Saint John, “Approach for Extracting the Complex Dielectric Function Spectra in Weakly-Absorbing Regions,” presented by N. J. Podraza at the 6th International Conference on Spectroscopic Ellipsometry, Kyoto, Japan, May 2013.
  34. Poster Presentation – Chen, J., Z. Huang, P. Koirala, N. J. Podraza, and R. W. Collins, “Applications of Through-the-Glass Spectroscopic Ellipsometry in Thin Film Analysis,” presented by R. W. Collins at the 6th International Conference on Spectroscopic Ellipsometry, Kyoto, Japan, May 2013.
  35. Invited Oral Presentation – Collins, R. W., N. J. Podraza, and A. S. Ferlauto, “Advances in Real Time Spectroscopic Ellipsometry Instrumentation and Analysis with Applications from Thin Film Research to Manufacturing,” presented by R. W. Collins at the 6th International Conference on Spectroscopic Ellipsometry, Kyoto, Japan, May 2013.
  36. Oral Presentation – Dahal, L. R., Z. Huang, D. Attygalle, C. Salupo, N. J. Podraza, and R. W. Collins, “Correlations between Mapping Spectroscopic Ellipsometry Results and Solar Cell Performance for Evaluations of Non-Uniformity in Thin Film Silicon Photovoltaics,” presented by R. W. Collins at the IEEE 38th Photovoltaic Specialists Conference, Austin, TX, June 2012.
  37. Oral Presentation – Attygalle, D., V. Ranjan, P. Aryal, P. Pradhan, S. Marsillac, N. J. Podraza, and R. W. Collins, “Optical Monitoring and Control of Cu(In1-xGax)Se2 by Three-Stage Co-Evaporation Using Real Time Spectroscopic Ellipsometry,” presented by R. W. Collins at the IEEE 38th Photovoltaic Specialists Conference, Austin, TX, June 2012.
  38. ‡ Oral Presentation – Aryal, P., D. Attygalle, N. J. Podraza, S. Marsillac, and R. W. Collins, “Large Area Compositional Mapping of Cu(In1-xGax)Se2 Materials and Devices with Spectroscopic Ellipsometry,” presented by P. Aryal at the IEEE 38th Photovoltaic Specialists Conference, Austin, TX, June 2012.
  39. # Oral Presentation - Motyka, M. A., M. W. Horn, and N. J. Podraza, “Optical Properties, Composition, and Structure of Nanocomposite Vanadium Oxide Thin Films,” presented by M. A. Motyka at the 2012 Electronic Materials Conference in University Park, PA, June 2012.
  40. Oral Presentation - Fried, M., G. Juhasz, C. Major, O. Polgar, A. Nemeth, P. Petrik, L. R. Dahal, Z. Huang, D. Attygalle, S. Ambalanath, J. Chen, N. J. Podraza, and R. W. Collins, “Fast Imaging / Mapping Spectroscopic Ellipsometry for Large Area Samples,” presented by M. Fried at the 2012 European Materials Research Society Spring Meeting in Stroudsburg, Germany, May 2012.
  41. ‡ Oral Presentation - Shen, H., Y. Yuwen, Y. Ke, X. Wang, C. Kendrick, N. Podraza, T. Mayer, E. Dickey, and J. Redwing, “Radial Junction Solar Cells Based on Heterojunction with Intrinsic Thin Layer Structure,” presented by H. Shen at the 2012 Materials Research Society Spring Meeting in San Francisco, CA, April 2012.
  42. Oral Presentation - Attygalle, D., P. Aryal, P. Pradhan, N. J. Podraza, R. W. Collins, V. Ranjan, H. Khatri, and S. Marsillac, “Optical Monitoring and Control of Cu(In,Ga)Se2 Thin Film Deposition: Analysis of the Copper Transitions in Three-Stage Co-Evaporation,” presented by D. Attygalle at the 2012 Materials Research Society Spring Meeting in San Francisco, CA, April 2012.
  43. Oral Presentation - Collins, R. W., L. R. Dahal, Z. Huang, D. Attygalle, P. Aryal, J. Chen, M. Sestak, N. J. Podraza, S. Marsillac, A. Nemeth, P. Petrik, G. Juhasz, C. Major, and M. Fried, “Large Area Imaging / Mapping Spectroscopic Ellipsometry for Multilayer Analysis in Thin Film Photovoltaics,” presented by R. W. Collins at the 2012 Materials Research Society Spring Meeting in San Francisco, CA, April 2012.
  44. Invited Oral Presentation - Collins, R. W., L. R. Dahal, Z. Huang, C. Salupo, D. Attygalle, N. J. Podraza, S. Marsillac, A. Nemeth, P. Petrik, G. Juhasz, C. Major, O. Polgar, and M. Fried, “Spatial Dependence of Phase Diagrams in Roll-to-Roll Plasma-Enhanced Chemical Vapor Deposition of Thin Film Hydrogenated Silicon,” presented by R. W. Collins at the 2012 Materials Research Society Spring Meeting in San Francisco, CA, April 2012.
  45. Oral Presentation - Attygalle, D., V. Ranjan, P. Aryal, P. Pradhan, H. Khatri, N. J. Podraza, S. Marsillac, and R. W. Collins, “Real-Time Spectroscopic Ellipsometry of Cu(In,Ga)Se2 Thin Film Deposition: Copper Transitions in 3-Stage Co-Evaporation Process,” presented by D. Attygalle at the American Vacuum Society 58th International Symposium, Nashville, TN, November 2011.
  46. # Oral Presentation - Motyka, M. A., B. D. Gauntt, R. Misra, J. Tashman, J. H. Lee, D. Schlom, P. Schiffer, O. Cabarcos, M. W. Horn, and N. J. Podraza, “Optical Properties and Structure of Vanadium Oxide Thin Films,” presented by M. A. Motyka at the American Vacuum Society 58th International Symposium, Nashville, TN, November 2011.
  47. Oral Presentation - Podraza, N. J., D. B. Saint John, A. Gephart, J. Li “Comparison between Ex Situ and Real Time Spectroscopic Ellipsometry Measurements of Structurally Graded Si1-xGex:H Thin Films,” presented by N. J. Podraza at the American Vacuum Society 58th International Symposium, Nashville, TN, November 2011.
  48. # Oral Presentation - Motyka, M. A., B. D. Gauntt, E. C. Dickey, M. W. Horn, and N. J. Podraza, “Processing and Stability Studies of Vanadium Oxide Thin Films for Microbolometer Applications,” presented by M. A. Motyka at the American Vacuum Society 57th International Symposium, Albuquerque, NM, October 2010.
  49. # Oral Presentation - Saint John, D. B., H.-B. Shin, M.-Y. Lee, E. C. Dickey, T. N. Jackson, and N. J. Podraza, “Real Time Spectroscopic Ellipsometry Studies of Amorphous and Nanocrystalline Si1-xGex:H Thin Films for Microbolometer Applications,” presented by D. Saint John at the American Vacuum Society 57th International Symposium, Albuquerque, NM, October 2010.
  50. ‡ Oral Presentation - Petrina, S., T. Saito, N. J. Podraza, M. Hickner, “Dynamic Swelling, Morphology, and Conductivity in Thin Ionic Block Copolymer Films,” presented by S. Petrina at the American Chemical Society Fall 2010 Meeting and Exposition, Boston, MA, August 2010.
  51. Poster Presentation - Li, J., B. D. Gauntt, N. J. Podraza, T. N. Jackson, and E. C. Dickey, “Micro-Twinned VOx Nanocrystalline Film and Small-Polaron Hopping Conduction,” presented by J. Li at the Microscopy and Microanalysis 2010 Meeting, Portland, OR, August 2010.
  52. ‡ Oral Presentation - Shin, H.-B., M.-Y. Lee, D. Saint John, N. J. Podraza, and T. N. Jackson, “High Temperature Coefficient of Resistance Sputtered a-Ge for Uncooled Microbolometer Applications,” presented by H.-B. Shin at the 52nd Annual Electronic Materials Conference, South Bend, IN, June 2010.
  53. ‡ Oral Presentation - Sestak, M. N., N. J. Podraza, A. Desireddy, C. Joshi, T. P. Bigioni, and R. W. Collins, “Spectroscopic Ellipsometry Studies of Au Nanoparticle Films,” presented by M. N. Sestak at the Fifth International Conference on Spectroscopic Ellipsometry, Albany, NY, May 2010.
  54. Poster Presentation - Podraza, N. J., P. Chen, X. S. Xu, A. Melville, C. Heikes, E. Vlahos, J. F. Ihlefeld, R. Ramesh, V. Gopalan, D. G. Schlom, and J. L. Musfeldt, “Optical Properties of Bismuth Ferrite Thin Films,” presented by N. J. Podraza at the Fifth International Conference on Spectroscopic Ellipsometry, Albany, NY, May 2010.
  55. ‡ Poster Presentation - Petrina, S. A., N. J. Podraza, and M. A. Hickner, “Swelling of Ionic Block Copolymers Via Controlled Humidity Measured by Real Time Spectroscopic Ellipsometry,” presented by S. Petrina at the Fifth International Conference on Spectroscopic Ellipsometry, Albany, NY, May 2010.
  56. Oral Presentation - Podraza, N. J., D. Saint John, S. W. Ko, H. M. Schulze, J. Li, E. C. Dickey, and S. Trolier-McKinstry, “Spectroscopic Ellipsometry Studies of Nickel Manganite Spinel Thin Films for Microbolometer Applications,” presented by N. J. Podraza at the Fifth International Conference on Spectroscopic Ellipsometry, Albany, NY, May 2010.
  57. # Poster Presentation - Saint John, D. B., E. C. Dickey, R. W. Collins, and N. J. Podraza, “Real Time Spectroscopic Ellipsometry Studies of Amorphous and Microcrystalline Si1-xGex:H Thin Films,” presented by D. B. Saint John at the Fifth International Conference on Spectroscopic Ellipsometry, Albany, NY, May 2010.
  58. # Poster Presentation - Motyka, M. A., B. D. Gauntt, E. C. Dickey, M. W. Horn, and N. J. Podraza, “Analysis of the Optical Properties and Structure of Sputtered Vanadium Oxide Thin Films by Spectroscopic Ellipsometry,” presented by M. A. Motyka at the Fifth International Conference on Spectroscopic Ellipsometry, Albany, NY, May 2010.
  59. ‡ Oral Presentation - Kramer, A., E. C. Dickey, and N. J. Podraza, “Evaluation of Anodic Tantalum Oxide by Spectroscopic Ellipsometry,” presented by A. Kramer at the 2010 Spring Center for Dielectric Studies Meeting, State College, PA, May 2010.
  60. ‡ Oral Presentation - Chen, P., X. S. Xu, J. L. Musfeldt, A. C. Santulli, C. Koenigsmann, S. S. Wong, N. J. Podraza, A. Melville, D. G. Schlom, and R. Ramesh, “Optical Properties of Tetragonal and Nanoscale BiFeO3,” presented by P. Chen at the American Physical Society Spring Meeting, Portland, OR, March 2010.
  61. ‡ Oral Presentation - Lee, C.-H., N. J. Podraza, X. Xi, and D. G. Schlom, “The Optical Band Gap of Srn+1TinO3n+1 Ruddlesden-Popper Phases,” presented by C.-H. Lee at the American Physical Society Spring Meeting, Portland, OR, March 2010.
  62. Invited Oral Presentation – Schlom, D. G., C.-H. Lee, N. D. Orloff, L. Fitting Kourkoutis, H. Qu. Wang, Y. Kim, N. J. Podraza, R. F. Berger, E. Vlahos, M. Bernhagen, R. Uecker, V. Gopalan, X. X. Xi, J. B. Neaton, J. D. Brock, D. A. Muller, C. J. Fennie, I. Takeuchi, and J. C. Booth, “The Effect of Strain and Dimensionality on SrTiO3: The Emergence of Ferroelectricity in Strained Srn+1TinO3n+1,” presented by D. G. Schlom at the 2010 Materials Research Society Spring Meeting, San Francisco, CA, April 2010.
  63. Invited Oral Presentation - Podraza, N. J., D. Saint John, J. Li, J. A. Stoke, E. C. Dickey, C. R. Wronski, and R. W. Collins, “Real Time Spectroscopic Ellipsometry as a means for Characterization and Control of Si1-xGex:H Layers for Thin Film PV,” presented by N. J. Podraza at the 6th Workshop on the Future Generation of Photovoltaics, Tokyo, Japan, March 2010.
  64. # Oral Presentation - Motyka, M. A., B. D. Gauntt, E. C. Dickey, M. W. Horn, and N. J. Podraza, “Spectroscopic Ellipsometry Studies of Sputtered Vanadium Oxide Thin Films,” presented by M. A. Motyka at the American Vacuum Society 56th International Symposium, San Jose, CA, November 2009.
  65. # Oral Presentation - Saint John, D., H.-B. Shin, M.-Y. Lee, J. Li, E. Dickey, R. Collins, M. Taylor, S. Ajmera, A. J. Syllaios, T. Jackson, and N. J. Podraza, “Real Time Spectroscopic Ellipsometry Studies of Si:H and Ge:H Thin Films for Microbolometer Applications,” presented by D. Saint John at the American Vacuum Society 56th International Symposium, San Jose, CA, November 2009.
  66. ‡ Oral Presentation - Brooks, C. M., E. Vlahos, M. D. Biegalski, N. J. Podraza, C.-J. Eklund, C. J. Fennie, K. M. Rabe, V. Gopalan, and D. G. Schlom, “Evidence for Ferroelectricity in Strained CaTiO3 Thin Films Grown by MBE,” presented by C. M. Brooks at the 2009 Materials Research Society Fall Meeting, San Francisco, CA, December 2009.
  67. Oral Presentation - Saint John, D., H.-B. Shin, M.-Y. Lee, J. Li, E. Dickey, R. Collins, M. Taylor, S. Ajmera, A. J. Syllaios, T. Jackson, and N. J. Podraza, “Correlations between Optical, Electrical, and Microstructural Properties of Si:H and Ge:H Thin Films,” presented by N. J. Podraza at the 23rd International Conferences on Amorphous and Nanocrystalline Semiconductors, Utrecht, The Netherlands, August 2009.
  68. ‡ Oral Presentation - Gauntt, B. D., N. J. Podraza, and E. C. Dickey, “Influence of Disorder on the Conduction in Vanadium Oxide Thin Films,” presented by B. D. Gauntt at the 23rd International Conferences on Amorphous and Nanocrystalline Semiconductors, Utrecht, The Netherlands, August 2009.
  69. ‡ Oral Presentation - Mourey, D., D. Zhao, D. Saint John, N. Podraza, and T. Jackson, “Plasma-Enhanced Atomic Layer Deposition ZnO TFTs,” presented by D. Mourey at the 51st Annual Electronic Materials Conference, University Park, PA, June 2009.
  70. ‡ Oral Presentation - Lee, C.-H., X. Xi, D. Schlom, W. Tian, N. Orloff, and N. Podraza, “The Growth and Properties of Srn+1TinO3n+1 Ruddlesden-Popper Phases,” presented by C.-H. Lee at the 51st Annual Electronic Materials Conference, University Park, PA, June 2009.
  71. Oral Presentation - Cabarcos, O., B. Gauntt, N. Podraza, E. Dickey, D. Allara, and M. Horn, “The Optical Properties and Structure of Magnetron Sputtered Vanadium Oxide Thin Films,” presented by O. Cabarcos at the 51st Annual Electronic Materials Conference, University Park, PA, June 2009.
  72. ‡ Oral Presentation - Lee, M.-Y., H.-B. Shin, D. Saint John, N. Podraza, and T. Jackson, “1/f Noise Characterization of Si:H Thin Films for Microbolometers,” presented by M.-Y. Lee at the 51st Annual Electronic Materials Conference, University Park, PA, June 2009.
  73. Oral Presentation - Saint John, D., H.-B. Shin, M.-Y. Lee, J. Li, E. Dickey, R. Collins, M. Taylor, S. Ajmera, A. J. Syllaios, T. Jackson, and N. Podraza, “Microstructural and Electronic Properties of Thin Film Si:H and Ge:H for Uncooled Microbolometer Applications,” presented by N. Podraza at the 51st Annual Electronic Materials Conference, University Park, PA, June 2009.
  74. ‡ Oral Presentation - Yoon, H., Y. Yuwen, C. Kendrick, G. Barber, S. Eichfeld, H. Shen, Y. Ke, N. Podraza, E. Dickey, T. Mallouk, J. Redwing, C. Wronski, and T. Mayer, “Etched Silicon Pillar Array Solar Cells,” presented by H. Yoon at the 51st Annual Electronic Materials Conference, University Park, PA, June 2009.
  75. Oral Presentation - Podraza, N. J., S. M. Pursel, C. Chen, R. W. Collins, and M. W. Horn, “Mueller Matrix Ellipsometry Studies of the Optical Properties and Structure of Serial Bi-Deposited Titanium Oxide Sculptured Thin Films,” presented by N. J. Podraza at the American Vacuum Society 55th International Symposium, Boston, MA, October 2008.
  76. Oral Presentation - Podraza, N. J., B. D. Gauntt, K. Wells, N. Fieldhouse, D. Saint John, R. W. Collins, E. C. Dickey, and M. W. Horn, “Optical Properties and Structure of Magnetron Sputtered Vanadium Oxide Thin Films,” presented by N. J. Podraza at the American Vacuum Society 55th International Symposium, Boston, MA, October 2008.
  77. Determined by Spectroscopic Ellipsometry,” presented by N. J. Podraza at the 2008 Spring Center for Dielectric Studies Meeting, St. Louis, MI, May 2008.
  78. * Oral Presentation - Li, J., R. W. Collins, J. A. Stoke, L. Dahal, D. Sainju, J. Chen, A. Parikh, and N. J. Podraza, “Accurate Determination of Dielectric Functions of Thin Films and Interfaces in Photovoltaic Devices: Critical Issues in Optical Modeling,” presented by R. W. Collins at the 2008 Materials Research Society Spring Meeting, San Francisco, CA, March 2008.
  79. * Invited Oral Presentation - Collins, R.W., D. Sainju, L. Dahal, J. Li, J. A. Stoke, N. J. Podraza, and X. Deng, “Optical Properties of Ag/ZnO Back-reflectors for Thin Film Si Photovoltaics,” presented by R. W. Collins at the 2008 Materials Research Society Spring Meeting, San Francisco, CA, March 2008.
  80. * Oral Presentation - Stoke, J. A., L. Dahal, J. Li, N. J. Podraza, X. Cao, X. Deng, and R. W. Collins, “Developments in Growth and Optical Property Analyses of Si:H Based Multijunction n-i-p Solar Cells,” presented by R. W. Collins at the 2008 Materials Research Society Spring Meeting, San Francisco, CA, March 2008.
  81. † Oral Presentation - Cao, X., J. A. Stoke, J. Li, N. J. Podraza, W. Du, X. Yang, D. Attygalle, X. Liao, R. W. Collins, and X. Deng, “Fabrication and Optimization of Si:H n-i-p Single-junction Solar cells using Si:H Phase Diagram Concepts developed by Real Time Spectroscopic Ellipsometry (RTSE),” presented by J. Li at the 22nd International Conference on Amorphous and Nanocrystalline Semiconductors, Breckenridge, CO, August 2007.
  82. † Oral Presentation - Stoke, J. A., N. J. Podraza, J. Li, X. Cao, X. Deng, and R. W. Collins, “Advanced Deposition Phase Diagrams for Guiding Si:H-based Multijunction Solar Cells,” presented by J. A. Stoke at the 22nd International Conference on Amorphous and Nanocrystalline Semiconductors, Breckenridge, CO, August 2007.
  83. Poster Presentation - Podraza, N. J., J. Li, C. R. Wronski, E. C. Dickey, M. W. Horn, and R. W. Collins, “Analysis and Control of Mixed-Phase Amorphous+Microcrystalline Si:H by Real Time Spectroscopic Ellipsometry,” presented by N. J. Podraza at the 22nd International Conference on Amorphous and Nanocrystalline Semiconductors, Breckenridge, CO, August 2007.
  84. Poster Presentation - Podraza, N. J., B. D. Gauntt, K. E. Wells, S. S. N. Bharadwaja, R. J. Carey, C. Venkatasubramanian, J. Li, E. C. Dickey, M. W. Horn, and R. W. Collins, “Optical Properties and Structure of Magnetron Sputtered Vanadium Oxide Thin Films,” presented by N. J. Podraza at the 22nd International Conference on Amorphous and Nanocrystalline Semiconductors, Breckenridge, CO, August 2007.
  85. Oral Presentation - Podraza, N. J., J. Li, C. R. Wronski, E. C. Dickey, M. W. Horn, and R. W. Collins, “Analysis of Structurally and Compositionally Graded Si1-xGex:H Thin Films by Real Time Spectroscopic Ellipsometry,” presented by N. J. Podraza at the 22nd International Conference on Amorphous and Nanocrystalline Semiconductors, Breckenridge, CO, August 2007.
  86. † Poster Presentation - Marsillac, S., N. Barreau, H. Khatri, D. Sainju, J. Li, A. Parikh, N. J. Podraza, and R. W. Collins, “Spectroscopic Ellipsometry Studies of Top Window and Back Contacts in Chalcopyrite Photovoltaics Technology,” presented by J. Li at the Fourth International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007.
  87. Poster Presentation - Chen, C., C. Ross, N. J. Podraza, and R. W. Collins, “Evolution of Surface Roughness on Different Scales during Polycrystalline Film Processing as Measured by Multichannel Mueller Matrix Spectroscopy,” presented by N. J. Podraza at the Fourth International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007.
  88. Poster Presentation - Sainju, D., N. J. Podraza, P. J. van den Oever, X. Deng, and R. W. Collins, “Optical Properties of Ag/ZnO Interfaces,” presented by N. J. Podraza at the Fourth International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007.
  89. Poster Presentation - Podraza, N. J., C. R. Wronski, M. W. Horn, and R. W. Collins, “Analysis of Si1-xGex:H Thin Films with Graded Composition and Structure by Real-Time Spectroscopic Ellipsometry,” presented by N. J. Podraza at the Fourth International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007.
  90. † Oral Presentation - Li, J., N. J. Podraza, and R. W. Collins, “Real Time Spectroscopic Ellipsometry of Sputtered CdTe, CdS, and CdTe1-xSx Thin Films for Photovoltaic Applications,” presented by J. Li at the Fourth International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007.
  91. * Invited Oral Presentation - Collins, R. W., I. An, C. Chen, J. Li, and N. J. Podraza, “Multichannel Ellipsometry for Real-Time Stokes Vector and Mueller Matrix Spectroscopies: Current Status and Future Prospects,” presented by R. W. Collins at the Fourth International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007.
  92. * Oral Presentation - Li, J., N. J. Podraza, X. Cao, J. A. Stoke, C. Das, R. W. Collins, and X. Deng, “Development of Hydrogen-Diluted-Graded Microcrystalline Si Thin Films,” presented by R. W. Collins at the 2006 Materials Research Society Spring Meeting, San Francisco, CA, April 2006.
  93. † Oral Presentation - Sainju, D., N. J. Podraza, J. Li, M. Syed, and R. W. Collins, “Interface Dielectric Function in ZnO/Ag Structures for Applications as Back-Reflectors in Thin Film Solar Cells,” presented by D. Sainju at the 2006 American Physical Society March Meeting, Baltimore, MD, March 2006.
  94. * Poster Presentation - Podraza, N. J., C. R. Wronski, and R. W. Collins, “Surface Diffusion in Amorphous Semiconductor Deposition Processes from Analysis of Roughness Evolution,” presented by R. W. Collins at the 21st International Conference on Amorphous and Nanocrystalline Semiconductors, Lisbon, Portugal, September 2005.
  95. 7* Oral Presentation - Podraza, N. J., C. R. Wronski, and R. W. Collins, “Deposition Phase Diagrams for Si1-xGex:H from Real Time Spectroscopic Ellipsometry,” presented by R. W. Collins at the 21st International Conference on Amorphous and Nanocrystalline Semiconductors, Lisbon, Portugal, September 2005.
  96. Poster Presentation - Podraza, N. J., C. Chen, J. M. Flores, G. M. Ferreira, I. An, and R. W. Collins, “Optical Properties of Transparent Conducting Oxide Sculptured Thin Films for Applications in Thin Film Silicon Photovoltaics,” presented by N. J. Podraza at the 2004 Materials Research Society Spring Meeting, San Francisco, CA, April 2004.
  97. Oral Presentation - Podraza, N. J., C. Chen, I. An, G. M. Ferreira, P. I. Rovira, and R. W. Collins, “Analysis of the Optical Properties and Structure of Chiral Thin Films from the Complete Mueller Matrix,” presented by N. J. Podraza at the Third International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003.
  98. * Invited Oral Presentation - Collins, R. W., I. An, C. Chen, G. M. Ferreira, N. J. Podraza, and J. A. Zapien, “Multichannel Mueller Matrix Ellipsometer based on the Dual Rotating Compensator Principle,” presented by R. W. Collins at the Third International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003.

Colloquium, Seminar, and Other Public Talks

  1. Ghimire K., P. Uprety, I. Subedi, M. M. Junda, H. Haneef, D. Adhikari, P. Koirala, P. Pradhan, A. A. Ibdah, S. Marsillac, R. W. Collins, Y. Yan, and N. J. Podraza, "The Birth, Life, and Death of Thin Film Materials for Solar Cells," presented by N. J. Podraza at the University of North Texas, Department of Physics and Astronomy Colloquium, Denton, TX, January 2017.
  2. Ghimire K., M. M. Junda, P. Uprety, I. Subedi, A. Ibdah, P. Koirala, S. Marsillac, R. W. Collins, Y. Yan, and N. J. Podraza, "Spectroscopic Ellipsometry of Thin Film Solar Cells: Monitoring Growth, Degradation, and Devices," Presented by N. J. Podraza, at the Eindhoven University, Eindhoven, the Netherlands, June2.
  3. N. J. Podraza, "A Perfect Match: Spectroscopic Ellipsometry Applied to Thin Film Photovoltaics," presented by N. J. Podraza at the Johannes Kepler University, Linz, Austria, June 2016.
  4. N. J. Podraza, "Spectroscopic Ellipsometry of Thin Film Solar Cells: Monitoring Growth, Degradation, and Devices," presented by N. J. Podraza at the Institute of Energy and Climate Research Forschungszentrum, Julich, Germany, June 2016.
  5. N. J. Podraza, "Exploiting the Optical Response of Matter for Fun (Science) and Profit (Manufacturing)," presented by N. J. Podraza at the University of Michigan Lurie Nanofabrication Facility Seminar, Ann Arbor, MI, November 2015.
  6. N. J. Podraza, “Utilizing Optical Characterization for Materials and Device Development,” presented by N. J. Podraza at the Ohio University Condensed Matter and Surface Science Colloquium, Athens, OH, April 2014.
  7. N. J. Podraza, “Interactions Between Light and Matter: Tailoring Properties through Microstructure,” presented by N. J. Podraza at NEG Corporation, Nagahama Shiga, Japan, June 2013.
  8. N. J. Podraza, “Interactions Between Light and Matter: Tailoring Properties through Microstructure,” presented by N. J. Podraza at the Brigham Young University Department of Chemistry Seminar, Provo, UT, April 2013.
  9. N. J. Podraza, “Interactions Between Light and Matter: Tailoring Properties through Microstructure,” presented by N. J. Podraza at the University of North Texas Department of Physics Colloquium, Denton, TX, November 2011.
  10. N. J. Podraza, “Interactions Between Light and Matter: Tailoring Properties through Microstructure,” presented by N. J. Podraza at the University of Toledo Department of Physics and Astronomy Colloquium, Toledo, OH, January 2011.
  11. N. J. Podraza, “Non-Invasive, Non-Destructive Material Characterization by Spectroscopic Ellipsometry,” presented by N. J. Podraza at the Pennsylvania State University Department of Electrical Engineering Colloquium, University Park, PA, February 2010.